Advanced Surface Microscopy Inc

Advanced Surface Microscopy, Inc. has been a leader in Atomic Force Microscopy (AFM) since 1990. We provide comprehensive services, including repairs, equipment, and analytical testing.

Our services cover NanoScope AFM systems, consulting, training, calibration samples, and analytical services. We specialize in repairing and upgrading NanoScope AFM systems and offer used and refurbished systems with a standard warranty. Our expert consultants provide training and consulting services to maximize the benefits of NanoScope operation.

In terms of supplies, we offer calibration samples, measurement software, various AFM probes, and our DiscTrack Plus Media Measurement System. Our in-house AFMs are available for analytical services to analyze samples and solve problems.

Our corporate focus is on AFM and related scanning probe microscopy techniques. Led by Dr. Donald A. Chernoff, our skilled technical staff ensures precise and reliable results.

Since 1990, we have completed over 1,000 analytical projects for 200+ customers, pioneering tapping mode phase imaging and developing DiscTrack PlusTM.

Equipped with tools like Dimension 3100, NanoScope IV, and NanoScope V, our laboratory ensures accurate and traceable calibration standards.

Choose ASM for a speedy response, confidentiality, and miscellaneous services like consultation, expert testimony, and SPM training.

Discover how we can enhance your AFM experience. Contact us today!