Scientific Computing International

Founded in 1993, Scientific Computing International (SCI) is a leading innovator in advanced metrology systems and analysis software. Headquartered in Carlsbad, California, SCI serves major companies in semiconductor, optoelectronics, data storage, display, MEMS, and optical coating industries. Our mission is to solve the most critical metrology challenges by offering precise, cutting-edge solutions tailored to our clients' needs.

SCI's expanding technology suite includes multi-angle spectroscopic ellipsometry, polarized reflectometry, transmission, and scatterometry. Our patented technologies provide the highest index measurement accuracy in the industry, with resolutions 100 times better than existing tools. These innovations ensure unparalleled accuracy, precision, and versatility in film analysis and critical dimension (CD) metrology.

Our comprehensive product portfolio supports clients throughout the entire product life cycle, from research and development to high-volume production. We specialize in custom metrology solutions, addressing specific requirements with unmatched speed and precision.

SCI operates a global network of sales, service, and support offices in China, Europe, Japan, Korea, Singapore, Taiwan, and the United States, ensuring worldwide reach and support. Explore SCI for advanced metrology solutions designed to meet tomorrow's most critical needs.