Sunrise Optical LLC

Sunrise Optical LLC (SOLLC), founded in 2006, is a premier American-owned optical instrumentation company specializing in advanced metrology solutions. We provide turnkey systems for topography measurements, catering to diverse industries including solar cell manufacturing, semiconductor capital equipment, and thin film metrology.

Our innovative product range includes precision tools for wafer thickness measurement, trench depth analysis, membrane thickness measurement, and MEMs tomography applications. Leveraging cutting-edge laser and LED technologies, SOLLC ensures accurate and reliable measurements for crystalline and thin film materials.

ZebraOptical.com and Optoprofiler.com, domains of Sunrise Optical LLC, showcase our expertise in dimensional and stress metrology, offering solutions for bow and warp measurements, interferometric probe assessments, and non-contact wafer thickness and topography analyses. Our advanced quantum efficiency (QE) uniformity measurements utilize white light and color scanner technology, ensuring superior spectral mapping characterization.

Committed to excellence and innovation, Sunrise Optical LLC delivers scalable metrology solutions for glass substrates, providing precise measurements for a variety of applications.