C-RED 3 | Low SWaP Uncooled High-Speed SWIR camera
Description
Specially designed for short exposure times applications, C-RED 3 is the fastest VGA uncooled camera for short wave infrared (SWIR) imaging.
C-RED 3 is using a TEC-less 640 x 512 InGaAs PIN Photodiode detector with 15 μm pixel pitch for high resolution, which embeds an electronic shutter with integration pulses shorter than 1 μs.
Operating from 0.9 to 1.7 µm, C-RED 3 is also capable of windowing down for higher frame rate. Multiple on-board functionalities are offered such as user configurations, NUC tables, adaptive bias and HDR mode.
Autonomous, ultra compact and perfect for stable temperature environments, C-RED 3 expands the C-RED family, offering a solution for every application and every budget.
C-RED 3 can also be supplied as OEM. Some applications include free space optical telecommunications (FSO), wavefront sensing camera, laser guide star, high-speed imaging, tracking etc.
C-RED 3 | Low SWaP Uncooled High-Speed SWIR camera
Specifications |
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|---|---|
| Camera Type: | Security, Military |
| Array Type: | InGaAs |
| Spectral Band: | 900-1700um |
| # Pixels (Height): | 640 |
| # Pixels (Width): | 512 |
| Pixel Pitch: | 15 um |
| Array Cooling: | Uncooled |
Features
- FASTER: C-RED3 is the fastest SWIR InGaAs in its category with 600FPS full frame.
- LOW NOISE: C-RED3 offers <50e- of readout noise for high sensitivity.
- HIGH DYNAMIC RANGE WITH HDR MODE: 93 dB of linear dynamic range and true 16-bit images. Enhance your vision with the HDR module enabled at full frame rate.
- LOW SWaP: Affordable OEM version available for easy integration in complex systems.
- UNIQUE ADAPTIVE BIAS: The adaptive BIAS correction allows to use the uncooled C-RED 3 in a variable temperature environment.
- COMPREHENSIVE SDK: Each camera comes with a GUI and free SDK to develop your own solution under Linux, Windows and Jetson. Plug-ins are available for: μManager, Labview, Python, C, C++, and more.
Applications
Night Vision
Long Range Surveillance And Tracking
Active Imaging
Cloud Or Smoke Penetration
Background Contrast
Solar Cells Inspection
Semiconductor Inspection
Quality Control
Production Control
Non Destructive Inspections
Environmental Monitoring
Secure Laser Communication
Astronomical Observations
Adaptive Optics
Overpainting
Non Destructive Analysis
Erased Marking
Counterfeiting
Carbon Black Using
Alteration Identification
For pricing, technical or any other questions please contact the supplier
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United States
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On FindLight:
since 2024