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Page 2 - Spectrophotometers

NIRS DS2500 Petro Analyzer
Metrohm USA
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NIRS DS2500 Petro Analyzer
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The NIRS DS2500 Petro Analyzer is the tried and tested, flexible solution for quality control and routine analysis of fuels and is compliant with the standard ASTM D6122. Resistant to dust, moisture, and vibrations, the NIRS DS2500 Petro Analyzer is not only suitable for laboratory use, but also use in direct production ...

Specifications
Wavelength Range (reflectance): 400-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Optronic Laboratories Inc
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OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
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The OL 750-NVG is a specifically configured version of the OL 750 Spectroradiometer for NVG compatibility measurements. This complete turnkey system exceeds the requirements of MIL-L-85762A and incorporates direct viewing imaging optics. An optional built-in photometer is available, and as with all of our spectroradiometers, all ...

Specifications
Wavelength Range (reflectance): 200-30000nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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OL 750 AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Optronic Laboratories Inc
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OL 750 AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
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The OL 750 is an extremely versatile spectroradiometric measurement system capable of performing a variety of highly accurate optical radiation measurements under computer control in the ultraviolet, visible and infrared. The modular approach of the OL 750, coupled with an extensive selection of accessories and powerful application ...

Specifications
Wavelength Range (reflectance): 280-30000nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
Ibsen Photonics A/S
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
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Ibsen’s PEBBLE spectrometers combine an ultra compact form factor with high resolution and sensitivity as well as environmental ruggedness. PEBBLE VIS is based on the same proven diffraction grating technology used in all other Ibsen spectrometers. This ensures that PEBBLE can be manufactured in high quantities with very small ...

Specifications
Wavelength Range (reflectance): 360-830nm
Resolution: 6 nm
Minimum Scan Time: - sec
Data Sheet
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SM303 TE Cooled Back-Thinned CCD Spectrometer
Spectral Products
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SM303 TE Cooled Back-Thinned CCD Spectrometer
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Spectral Products is offering the new SM303 TE cooled back-thinned 1024 pixel array CCD spectrometer. The SM303 is ideal for UV/VIS/NIR spectrometry that requires very high signal to noise ratio and/or high dynamic range, like fluorescence, Rama, LED property testing applications. The back-thinned CCD has excellent sensitivity in UV ...

Specifications
Wavelength Range (reflectance): 200-1100nm
Resolution: 10 nm
Minimum Scan Time: 0,07 sec
Data Sheet
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SM445 Preconfigured High Resolution CCD Spectrometer
Spectral Products
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SM445 Preconfigured High Resolution CCD Spectrometer
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The SM445 is a new compact design CCD Spectrometer for use with a PC. Based on SP\'s special optical bench design, it supports many different applications where spectral or color measurements are required, including high dynamic range applications. The SM445 can accept light directly through its built in slit or via optical fiber. ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 0.01 sec
Data Sheet
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SM245 Highspeed CCD Spectrometer
Spectral Products
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SM245 Highspeed CCD Spectrometer
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Spectral Products is offering the new SM245 high speed 2048 pixel array CCD spectrometer. Thanks to the enhanced design on the electronic board of the SM245, the dark current noise level as well as the data acquisition speed have improved. Based on SP\'s special optical bench design, it supports many different applications where ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 1 sec
Data Sheet
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FilmTek 2000 SE
Scientific Computing International
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FilmTek 2000 SE
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The FilmTek™ 2000 SE benchtop metrology system provides unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. It is ideally suited for academic and R&D settings. The FilmTek™ 2000 SE combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry to ...

Specifications
Wavelength Range (reflectance): 240-1700nm
Resolution: 0.3 nm
Minimum Scan Time: 2 sec
Data Sheet
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FilmTek 2000 PAR
Scientific Computing International
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FilmTek 2000 PAR
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The FilmTek™ 2000 PAR is a low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. This system combines patented DUV-NIR reflectometry with wafer auto-loader and pattern recognition to deliver unmatched metrology performance at this price point. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 0.2 sec
Data Sheet
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FilmTek 2000 PAR-SE
Scientific Computing International
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FilmTek 2000 PAR-SE
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The FilmTek™ 2000 PAR-SE combined metrology line is our most advanced benchtop metrology solution, with the highest accuracy, precision, and versatility in the industry. The FilmTek™ 2000 PAR-SE was engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 1 sec
Data Sheet
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SpectrOil M/C-W
Wilks - a Spectro Scientific Co
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SpectrOil M/C-W
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Originally designed for military applications in the mid 1990s, the SpectrOil M is the only in service oil analysis spectrometer approved by the US Department of Defense (DoD) Joint Oil Analysis Program (JOAP). Since its development, the SpectrOil M has been the industry standard for reliable, deployable spectrometers that perform ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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SpectrOil 110E
Wilks - a Spectro Scientific Co
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SpectrOil 110E
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The SpectrOil 100 Rotating Disc Electrode Optical Emission Spectrometer (RDE-OES) is the eighth generation of the market leading RDE elemental spectrometer. It is widely used in commercial oil laboratories, on-site or trailer labs, as a proven means of precisely determining elemental composition in lubricating oil, coolant, light or ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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UltraPath 380 nm - 730 nm UPVIS
WPI
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UltraPath 380 nm - 730 nm UPVIS
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 380-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
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UltraPath 250 nm - 730 nm UPUV
WPI
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UltraPath 250 nm - 730 nm UPUV
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 250-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
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LED Spectrophotometer PCE-CRM 40
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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LED Spectrophotometer PCE-CRM 40
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With the LED spectrophotometer PCE-CRM 40, important photometric factors in the field of light measurement can be determined. These include the tristimulus values of XYZ, the u´ and v´ color location coordinates according to CIE 1976, and the xy color location coordinates according to CIE 1931. Moreover, further color ...

Specifications
Wavelength Range (reflectance): 360-780nm
Resolution: N/A nm
Minimum Scan Time: 0.5 sec
Data Sheet
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Spectrophotometer PCE-CSM 8
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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Spectrophotometer PCE-CSM 8
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The spectrophotometer PCE-CSM 8 was developed for quality control, offers a high accuracy and comes with a 3.5\" touch screen display. When using the spectrophotometer, you can choose between different colour spaces (CIE LAB, XYZ, Yxy, LCh, LUV) and 45/0 optics geometry. After a measurement with the spectrophotometer, the reading can ...

Specifications
Wavelength Range (reflectance): 400-700nm
Resolution: N/A nm
Minimum Scan Time: 1.5 sec
Data Sheet
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Spectrophotometer PCE-CSM 20
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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Spectrophotometer PCE-CSM 20
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PCE-CSM 20 is a handheld spectrophotometer used for high-quality color measurement. Featuring a single 8 mm aperture and including SCI and SCE specular modes for industrial color measuring applications, the PCE-CSM 20 offers a long battery life, a long life 4-color lamp and an easy-to-use portable design. Camera/illumination locating ...

Specifications
Wavelength Range (reflectance): 400-700nm
Resolution: N/A nm
Minimum Scan Time: 2.6 sec
Data Sheet
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Spectrophotometer PCE-CSM 21
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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Spectrophotometer PCE-CSM 21
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PCE-CSM 21 is a handheld spectrophotometer used for high-quality color measurement. Featuring a custom 4 mm aperture and including SCI and SCE specular modes for industrial color measuring applications, the PCE-CSM 21 offers a long battery life, a 9-color lamp and an easy-to-use portable design. The PCE-CSM 21 covers the full ...

Specifications
Wavelength Range (reflectance): 400-700nm
Resolution: N/A nm
Minimum Scan Time: 2.6 sec
Data Sheet
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Spectrophotometer PCE-CSM 30
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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Spectrophotometer PCE-CSM 30
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The table spectrophotometer, like any other spectrophotometer, is responsible for color measurement. This very accurate table spectrophotometer is intended for laboratory use to perform measurements on paper, textiles or, for example, reference samples. Measurements can be performed quickly and easily with this table ...

Specifications
Wavelength Range (reflectance): 400-700nm
Resolution: N/A nm
Minimum Scan Time: N/A sec
Data Sheet
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Spectrophotometer PCE-CSM 10
PCE Instruments UK Ltd Sub of PCE Holding GmbH
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Spectrophotometer PCE-CSM 10
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The spectrophotometer PCE-CSM 10 was developed for quality control, offers a high accuracy and comes with a 3.5\" touch screen display. When using the spectrophotometer, you can choose between different colour spaces (CIE LAB, XYZ, Yxy, LCh, CIE LUV, HunterLAB). After a measurement with the spectrophotometer, the reading can be used ...

Specifications
Wavelength Range (reflectance): 400-700nm
Resolution: N/A nm
Minimum Scan Time: 1.2 sec
Data Sheet
Inquire Price