WinCamD Series UV Converter
Description
- The UV beam impinges on a custom thin crystal faceplate which fluoresces in the visible.
- This crystal fluorescence is reimaged onto the camera.
- Coated crystal option for coherence lengths ≥1 mm.
WinCamD Series UV Converter
Specifications |
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Part Number (Dependent On Model): | BSFXX-X-XXX |
Aperture (BSF08): | 6.4 x 4.8 mm |
Aperture (BSF12): | 9.6 x 7.2 mm |
Aperture (BSF23): | 19.2 x 13.8 mm |
OAL X Diam. (BSF08): | 89 x 35 mm |
OAL X Diam. (BSF12): | 113 x 35 mm |
OAL X Diam. (BSF23): | 140 x ≤ 75 mm |
Configuration: | Axial cylinder |
Primary Options & Application: | C crystal: 193 nm | G crystal: Wide λ, low fluence | P crystal: λ <350, high fluence, fast | R crystal: Wide λ, high fluence, slow |
λ Nm Band: | C crystal: 110 – 225 | G crystal: 1 – 400 | P crystal: 110 – 350 | R crystal: 110 – 532 |
Relative Response @ 192, 248, 308 Nm: | C crystal: 400, N/A, N/A | G crystal: 10, 10, 50 | P crystal: 30, 30, 50 | R crystal: 50, 400, 400 |
Decay Time: | C crystal: 3 – 5 µs | G crystal: 0.5 µs | P crystal: 5 µs | R crystal: 3,000 µs |
Applications
- Economical, accurate, compact Beam Profiling of pulsed & CW UV sources.
- X‐ray Note 3 to 355 nm
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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Ships from:
United States
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Sold by:
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On FindLight:
since 2014
Frequently Asked Questions
The WinCamD Series UV Converter is used for economical, accurate, and compact beam profiling of pulsed and CW UV sources, as well as X-ray note 3 to 355 nm.
The UV beam impinges on a custom thin crystal faceplate which fluoresces in the visible. This crystal fluorescence is reimaged onto the camera.
The WinCamD Series UV Converter has a high resolution of 5 µm on a collimated beam.
The WinCamD Series UV Converter has a high damage threshold of 500 mJ/cm2, 1.5 W/cm2, 4 W max total. Higher power level? Contact DataRay.
The WinCamD Series UV Converter is used for X-ray note 3 to 355 nm and economical, accurate, compact beam profiling of pulsed and CW UV sources.