BladeCam2-XHR – ½" CMOS Beam Profiler System
Description
BladeCam2-XHR – ½" CMOS Beam Profiler System
Specifications |
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|---|---|
| Sensor Type: | CMOS |
| Measurable Sources: | CW |
| Wavelength Range: | 355 – 1150 nm |
| # Pixels (Width): | 2048 |
| # Pixels (Height): | 1536 |
| Pixel Size (Width): | 3.2 um |
| Pixel Size (Height): | 3.2 um |
| Max Full Frame Rate: | 6 Hz |
| ADC: | 10-bit |
| Wavelength Option (BladeCam2-XHR-ND4): | 355 to 1,150 nm |
| Wavelength Option (BladeCam2-XHR-UV): | 190 to 1,150 nm |
| Included Filters: | C-mount ND-1, ND-2, and ND-4. Filter options for 190-1,350nm and 1,480-1,610nm also available. |
| Shutter Type: | Rolling |
| Signal To RMS Noise: | 1,000:1 Hz |
| Opt./Elec.: | 30/60 dB |
| Dynamic Range: | 44 dB |
| Measurable Sources: | CW beams; Software configurable Auto-trigger |
| Multiple Cameras: | Up to 4 cameras, parallel capture. 1 to 8 cameras, serial capture. |
| Head Dimensions (W X H X D): | 46 x 46 x 16.5 mm |
| Optical Depth From Housing/filter To Sensor (no Window) ±0.2 Mm: | approximately 5.25/10.25mm |
| Mounting: | 4-40, 6-32, and M3 mounting points |
| Weight, Camera Head: | 85 g (3 oz) |
| Minimum PC Requirements: | Windows 7/8/8.1/10 64-bit, 4 GB RAM, USB 2.0/3.0 port |
| Certification: | RoHS, WEEE, CE |
Features
- 355 to 1150 nm, standard CMOS detector
- 1.3 Mpixel‚ 1280 x 1024 pixels, 6.6 x 5.3 mm active area
- 5.2 µm pixels
- HyperCal™ – Dynamic Noise and Baseline Correction software
- Port-powered USB 3.0; flexible screw locking 3 m cable; no power brick
- 10-bit ADC
- Window-free sensors standard for no fringing
- Electronic auto-shutter, 40 µs to 500 ms
- 1,000:1 SNR (30/60 dB Optical/Electrical)
- Field-replaceable image sensors
- M² option – beam propagation analysis, divergence, focus
Applications
- CW laser profiling
- Field servicing of lasers and laser-based systems
- Optical assembly & instrument alignment
- Beam wander & logging
- M² measurement with available M2DU stage
- Real-time laser beam profiling in research and development
- Alignment and optimization of optical systems
- Monitoring beam quality in laser machining and cutting applications
- Verification of beam parameters in medical and surgical lasers
- Education and laboratory training for laser systems
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
since 2014
Frequently Asked Questions
The pixel size of the BladeCam2™ beam profiler is 3.2 µm.
The BladeCam2™ beam profiler has a thickness of only 0.50” (12.84 mm).
Yes, the BladeCam2™ beam profiler is paired with DataRay's full featured, highly customizable, user-centric software.
The BladeCam2™ beam profiler is suitable for applications including CW laser profiling, field servicing of laser systems, optical assembly, instrument alignment, beam wander and logging, R&D, OEM integration, quality control, and M2 measurement with available M2DU stage.
The BladeCam2™ beam profiler has USB3 connectivity.
The sensor itself cannot be exposed to high-power beams directly. Users must use appropriate neutral density (ND) filters or beam samplers to avoid sensor damage.
Yes, the profiler software supports scripting and automation for repeated testing and quality assurance workflows.