Industrial Laser Monitoring System (ILMS)
Description
Industrial Laser Monitoring System (ILMS)
Specifications |
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Sensor Type: | CMOS |
Measurable Sources: | CW, Pulsed |
Wavelength Range: | 190-16,000nm |
# Pixels (Width): | 2,048 |
# Pixels (Height): | 2,048 |
Pixel Size (Width): | 5.5* um |
Pixel Size (Height): | 5.5* um |
Max Full Frame Rate: | 60 Hz |
ADC: | 12-bit |
Magnification: | 1 - 50x+ |
Minimum PC Requirements: | Windows 7/8/8.1/10/11 64-bit, 4 GB RAM, USB 2.0/3.0 port |
Weight‚ Camera W/ MagND And Filter Cover: | 5 lbs (2kgs) |
Mounting: | M6 and M3 mounting points |
Multiple Cameras: | Up to 4 cameras, parallel capture. 1 to 8 cameras, serial capture. |
Certification: | RoHS, WEEE, CE |
Measured & Displayed Profile Parameters: | Raw and smoothed profiles | Triangular running average filter up to 10% FWHM |
Manual Beam Attenuation: | Includes ND-1, ND-2, and ND-4 filter inserts |
Displayed Profiles: | Line, 2D & 3D plots. Normalized or un-normalized. Linear or Logarithmic, Zoom x10 2D, 3D in 10, 32 or max. colors or grayscale Contoured display at 10 and 32 colors |
Measurable Sources: | WinCamD-LCM: CW beams, pulsed sources; CW to 12.6 kHz with single pulse isolation |
Electronic Shutter Range: | WinCamD-LCM: USB 2.0 @ 12,600:1 (41 dB), USB 3.0 @ 25,000:1 (44 dB) |
Signal To RMS Noise: | WinCamD-LCM: 2,500:1 (34 dB optical / 68 dB electrical) |
Single Pulse Capture PRR: | WinCamD-LCM: USB 2.0 @ 6.3 kHz; USB 3.0 @ 12.6 kHz |
Input Optics NA: | ILMS-5-X: 0.17 | ILMS-10-X: 0.17 | ILMS-50-532-: 0.6 | ILMS-50-1064: 0.65 |
AR Coating Wavelength: | ILMS-X-UV: 250nm-425nm | ILMS-X-VIS: 425nm-675nm | ILMS-X-532: 532nm | ILMS-X-NIR: 750nm-1550nm | ILMS-X-1064: 1064nm |
* Effective Pixel Size: | Model specific, down to 5.5um/magnification |
Features
- Options from 190nm up to 16 μm
- Beam waist diameters down to a few μm
- High magnification options available (50X and beyond)
- Capable of measuring high power beams, up to kW range possible
- Three swappable filters for flexible attenuation
- Profiler easily removed from system for stand-alone use
- Optional calibrated pinhole aperture denotes working distance and helps provide protection against damage from beam misalignment
- Available without beam sampler for focused, low power beams
- Integrated power meter options (contact us for more information)
Applications
- Tightly focused beams, fiber ends, edge couplers, laser diodes, and more
- High power laser cutting systems
- Telecommunications
- Quality control
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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Ships from:
United States
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Sold by:
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On FindLight:
since 2014
Frequently Asked Questions
The ILMS is designed for profiling focused, high-power industrial lasers.
The ILMS has options from 190nm up to 16 μm, beam waist diameters down to a few μm, high magnification options available, and it is capable of measuring high power beams. It also has swappable filters, an optional calibrated pinhole aperture, and integrated power meter options.
No, the software included with the ILMS automatically accounts for the magnification of the system, so results do not require post-processing or corrections.
Yes, the ILMS can be used for quality control in applications such as tightly focused beams, fiber ends, edge couplers, laser diodes, and more.
Yes, the ILMS is compatible with most DataRay profilers.