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Fitted Gaussian and Top-Hat Scanning Slit Beam Profilers

Advanced High Power Laser Beam Analyzer
Duma Optronics
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Advanced High Power Laser Beam Analyzer
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Duma\'s High Power Laser Measuring Device is a robust all-in-one instrument with built-in state-of-the-art air-cooled beam dump, operating from 350 - 1600 nm lasers. It will measure M², BPP (Beam Propagation Parameters), Beam size at its focal position down to less than 100 microns. A unique feature allows measurement of ...

Specifications
Detector Type: Si
Wavelength Range: 350-1100nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
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Beam Analyzer System
Duma Optronics
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Beam Analyzer System
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The measuring technique is based on a multiple scanning knife-edge technology, combined with a tomographic image reconstruction for the creation of the 2D/3D display. When the drum spins, the knife-edges cut across the beam in an orthogonal plane to the direction of propagation. A stationary large detector inside the spinning drum ...

Specifications
Detector Type: Si, InGaAs
Wavelength Range: 190-2700nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
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M2 Beam Multi-Axis Knife Edge Scanning Laser Beam
Duma Optronics
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M2 Beam Multi-Axis Knife Edge Scanning Laser Beam
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The M² Beam provides analytical and graphical capability to measure the 2 axis M² figure of merit waist size and location of CW lasers. The M² factor is measured in accordance with the proposed ISO/CD 11 146.Additionaly, the instrument measures the profile width, position and power of the laser beam at intersection points along the ...

Specifications
Detector Type: Si, InGaAs
Wavelength Range: 400-1800nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width, User Selectable % Width
M^2 Measurement Capability: Yes
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Beam Analyzer USB
Duma Optronics
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Beam Analyzer USB
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High precision beam diagnostics for CW lasers. A wide spectral range from deep UV through 2700nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm with 0.1 µm resolution. The new USB version offers enhanced operation of the Beam Analyzer series, including: USB 2.0 interface, 12 bit device, and ...

Specifications
Detector Type: Si, InGaAs, Si+InGaAs
Wavelength Range: 350-2700nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width
M^2 Measurement Capability: No
Data Sheet
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On FindLight marketplace you will find 7 different Fitted Gaussian and Top-Hat Scanning Slit Beam Profilers from suppliers around the world. With just a few clicks you can compare different Fitted Gaussian and Top-Hat Scanning Slit Beam Profilers and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.