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Si+InGaAs Scanning Slit Beam Profilers

Beam Analyzer USB
Duma Optronics
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Beam Analyzer USB
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High precision beam diagnostics for CW lasers. A wide spectral range from deep UV through 2700nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm with 0.1 µm resolution. The new USB version offers enhanced operation of the Beam Analyzer series, including: USB 2.0 interface, 12 bit device, and ...

Specifications
Detector Type: Si, InGaAs, Si+InGaAs
Wavelength Range: 350-2700nm
Beam Waist Diameter Measurement: Second Moment (4s) Diameter, Fitted Gaussian and Top-Hat, 1/e^2 Width
M^2 Measurement Capability: No
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On FindLight marketplace you will find 3 different Si+InGaAs Scanning Slit Beam Profilers from suppliers around the world. With just a few clicks you can compare different Si+InGaAs Scanning Slit Beam Profilers and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.