SiTek Electro Optics AB
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Frequently Asked Questions

The SiTek 1L2,5 PSD is available in special UV- or YAG-enhanced and Nuclear versions.

The performance of a PSD-based measurement system is limited by its mechanical, optical, and electrical components. To achieve the best performance, a modulated light source, stable temperature, mechanically stable system, high optical resolution, and high resolution in division of the sum- and difference signals are recommended.

The pin configuration of the SiTek 1L2,5_CP1 is 1 Bias, 2 Output Y1, 3 N/C, and 4 Output Y2. Note that outputs Y1 and Y2 are interchangeable.

The resolution of the SiTek 1L2,5 PSD is determined by the system signal-to-noise ratio and is excellent due to its analogue nature.

The SiTek 1L2,5 PSD is typically used for distance and height measurement, alignment, position and motion measurements, and vibration studies.

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