Room Temperature Piezoelectric Carrier Series Stages
Description
The Carrier Series Stages by MultiFields Technologies are high-performance piezoelectric motion devices designed for precise scanning and positioning in applications such as precision optics and semiconductor characterization.
With their compact shape and powerful performance, these stages offer large-range motion without compromising on power. They ensure accurate positioning, closed-loop control, and customizable solutions for various applications in the field of microscopy and semiconductor characterization.
Room Temperature Piezoelectric Carrier Series Stages
Specifications |
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Axes Of Motion: | Two |
Travel Range: | 75 mm |
Load Capacity (Horizontal): | 2 kg |
Load Capacity (Vertical): | null kg |
Max Speed: | 20 mm/s |
Weight: | null kg |
Guiding Mechanism: | Other |
Voltage Requirement: | DC 24V |
Full-travel Pitch/yaw: | 0.8 mrad |
Drive Frequency (Max): | 20 kHz |
Min. Step: | ~ 30 nm |
Operating Temperature: | 10 – 40 °C |
Cables & Connectors: | Standard shielded cable D-Sub 9 Connector |
Main Material: | Aluminum alloy |
Effective Perforation: | 85 mm × 65 mm |
Required Installation Space: | 325 mm × 250 mm |
Dimensions: | 250 mm × 200 mm × 30 mm |
Features
- XY-directional range of 75 mm × 50 mm for versatile positioning
- Smallest step size of about 20 nm for high-resolution control
- Maximum velocity of 20 mm/s for fast and efficient operation
- Closed-loop sensing with 100 nm / 10 nm spatial resolution for precise feedback
- Guaranteed through-hole of 85 mm × 65 mm for a full range of motion
- Supports non-magnetic (.NM) and ultra-high vacuum (.UHV) options for enhanced versatility
- Main body made of aluminum alloy with hard oxide blackened coating for durability
Applications
- Precision optics alignment and characterization
- Semiconductor wafer inspection and testing
- Microscopy and imaging systems
- Metrology and measurement devices
- Nanotechnology research and development
- MEMS (Micro-Electro-Mechanical Systems) testing
- Material science research
- Super-resolution optical microscopy
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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Ships from:
China
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Sold by:
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On FindLight:
since 2020
Frequently Asked Questions
The XY-directional range for positioning is 75 mm × 50 mm.
The smallest step size is about 20 nm.
The maximum velocity is 20 mm/s.
The spatial resolution for closed-loop sensing is 100 nm / 10 nm.
The options for enhanced versatility include non-magnetic (.NM) and ultra-high vacuum (.UHV) options.