LensAFM
Description
he Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.
LensAFM
Specifications |
|
|---|---|
| Max Sample Size: | -- mm |
| Min Working Distance: | -- mm |
| Scan Range (X): | 110 um |
| Scan Range (Y): | 110 um |
| Scan Range (Z): | 22 um |
Features
- Mountable on virtually any optical microscope or 3D optical profilometer
- Equipped with an objective lens for a clear view of sample and cantilever
- Simple sample positioning using the optical microscope position manipulators Integrated motor for automated cantilever approach: Just bring your sample into optical focus and let the LensAFM do the rest
- Large AFM Z-range allows measurement of high structures
- Wide range of AFM modes available through the C3000 controller
- Simply intuitive: Nanosurf’s well-known “ease of use” will have you performing measurements in minutes!
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
Switzerland
-
Sold by:
-
On FindLight:
External Vendor
Claim Nanosurf AG Page to edit and add data
Frequently Asked Questions
Yes, the LensAFM can be mounted on virtually any optical microscope or 3D optical profilometer.
The LensAFM integrates perfectly into a researcher's workflow by mounting it on the optical microscope's turret like a regular objective lens. Researchers can screen the sample with normal objectives to find areas of interest and then perform AFM measurements to get higher resolution 3D information.
Yes, the LensAFM is designed to be simply intuitive and Nanosurf's "ease of use" will have you performing measurements in minutes.
The Nanosurf LensAFM is an atomic force microscope that extends the resolution and measuring capabilities of optical microscopes and profilometers.
The LensAFM can be used to analyze various physical properties of a measurement sample, in addition to providing 3D surface topography information.