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Frequently Asked Questions

The NaniteAFM is compact, robust, and easy to integrate. It requires only 300 cm3 in space and a stable docking site to mount the AFM. It uses a dovetail mounting plate at the back to allow quick and reproducible mounting, and the use of cantilevers with alignment grooves makes laser alignment unnecessary.

The NaniteAFM is ideal for custom integration, automating serial measurements, and coping with large, heavy, or curved samples.

The NaniteAFM has a topview camera with 2 µm lateral resolution that gives a perfect overview of the surface to localize the areas of interest on the sample and position them under the cantilever. It also has a sideview camera that shows the sample under the cantilever at an angle of 45 degrees and guides the user during the initial fast approach to within a few tens of micrometers of the sample before the AFM takes over for the final automatic approach.

The NaniteAFM is the optimal tool to enhance your imaging and analysis capabilities for quality control, providing nanoscale surface information. It works equally well for opaque and transparent samples, making it a well-established technique for surface analysis.

The NaniteAFM is a market-leading solution for AFM integration with the least restriction to sample dimensions. It is an AFM that has a tip-scanner, two inspection video cameras, and an on-board approach motor in an exceptionally small footprint.

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