Microscope Peak 2008-100X Inch
Description
This Peak® wide-field direct measuring microscope is ideallly suited to non-contact measurement of small parts. The microscope contains a reticle with an English linear measurinng rule that can be rotated by a ring on the eyepiece to permit measurement in any direction.
Focus is controlled by a helical twist ring which features an etched scale for depth calculation. The scale permits depth measurement accurate to within .1mm over a 22mm depth. The microscope sits on top of a clear, removable acrylic base with a cutout to permit manipulation of the object being inspected. A penlight and holder are included for illumination. A hard shell carrying case and lens tissue are included.
Microscope Peak 2008-100X Inch
Specifications |
|
|---|---|
| Supported Objectives: | 100x |
| Illumination: | Not Specified |
| Focus Control (Z Adjustment): | Fine |
| XY Mechanical Stage: | Not Included |
| Eyepiece: | Not Specified |
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
United States
-
Sold by:
-
On FindLight:
External Vendor
Claim Max Levy Autograph Inc Page to edit and add data
Frequently Asked Questions
The package includes a clear, removable acrylic base with a cutout to permit manipulation of the object being inspected, a penlight and holder for illumination, a hard shell carrying case, and lens tissue.
The scale permits depth measurement accurate to within .1mm over a 22mm depth.
The measuring range varies depending on the model, ranging from 0-0.03" to 0-6.0mm.
The microscope is ideally suited for non-contact measurement of small parts.
The working distance varies depending on the model, ranging from 5.82mm to 34.41mm.