Sunrise Optical LLC
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Frequently Asked Questions

The Range from Focus tool is limited to samples which have feature-rich surfaces, for which the system can measure and analyze defocused measurement of smooth surfaces.

The roughness parameters that can be calculated using the Range from Focus tool are Ra (arithmetic average), RMS (root mean squared), Rv (maximum valley depth), Rp (maximum peak height), Rt (maximum profile height), Rsk (skew), and Rku (kurtosis).

The principle of operation of the Range from Focus tool involves a precision stage that varies the z-position of the sample to produce both focused and blurred images. The coordinate from defocus tool can be used to calculate various surface parameters.

The Range from Focus tool is an optical tool developed by Sunrise Optical LLC for precise topography measurement of rough or feature-rich samples.

The technology used in the Range from Focus tool is similar to that presented in the Small Splatter metrology tool in their standard brochure.

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