alpha300 RA Modular Confocal Raman Microscopy System
Description
The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with Atomic Force Microscopy (alpha300 A) for high-resolution nanoscale surface characterization. Thus correlative Raman AFM imaging facilitates a comprehensive understanding of the samples. With the alpha300 RA the two complementary imaging techniques are available in a single instrument without compromise and are controlled by one software suite for the highest ease-of-use and reliability. Switching between the imaging techniques requires just a turn of the objective turret, with all imaging parameters automatically adjusted and the same sample area easily imaged with both techniques. The software also allows the effortless correlation of the Raman and AFM results and the image overlay. The alpha300 RA is furthermore ideally suited fo TERS (high-resolution Raman) AFM measurements.
alpha300 RA Modular Confocal Raman Microscopy System
Specifications |
|
|---|---|
| Excitation Wavelength: | VIS to NIR |
| Multi-Wavelength Capability: | Yes |
| Spectral Range: | 400-3500cm^-1 |
| Detector: | CCD |
Features
All features of the alpha300 R (Raman) and the alpha300 A (AFM) instruments provided in one microscope
Excellent combination of comprehensive surface characterization on the nanometer scale (AFM) with chemical imaging (Raman)
Ideally suited for simultaneous Raman-AFM measurements
Strictly correlative: moving the sample between the measurements not necessary
Convenient switching between the measurement techniques by rotation of the objective turret
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
Germany
-
Sold by:
-
On FindLight:
External Vendor
Claim Witec GmbH Page to edit and add data
Frequently Asked Questions
The alpha300 RA incorporates all the features of the alpha300 R (Raman) and the alpha300 A (AFM) instruments provided in one microscope. It offers an excellent combination of comprehensive surface characterization on the nanometer scale (AFM) with chemical imaging (Raman). It is strictly correlative, and moving the sample between the measurements is not necessary. It allows convenient switching between the measurement techniques by rotation of the objective turret.
Correlative Raman AFM imaging is a technique that facilitates a comprehensive understanding of the samples by combining two complementary imaging techniques, Raman microscopy, and Atomic Force Microscopy (AFM), in a single instrument without compromise.
TERS stands for Tip-Enhanced Raman Spectroscopy, which is a high-resolution Raman AFM measurement technique.
The alpha300 RA allows simultaneous Raman-AFM measurements, which means that the two complementary imaging techniques are available in a single instrument without compromise. It also allows the effortless correlation of the Raman and AFM results and the image overlay.
The alpha300 RA is an integrated Raman AFM system that combines the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with Atomic Force Microscopy (alpha300 A) for high-resolution nanoscale surface characterization.