GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
Description
The Exicor® GEN5 and GEN6 systems are large format sample measurement units built on the core Exicor low level birefringence measurement technology and precision automated motion control elements. These platforms provide unsurpassed low level birefringence measurements to support the precision characterization of display related materials for the LCD industry (Generation 5+ compensation films and glass substrates, etc.) The systems are backward compatible with earlier generation models. The system designs are scalable to larger materials and can easily be adapted to other non-display material applications such as low tech sheeting materials and commercial window glass. With a scannable area of 1150 mm x 1375 mm, the GEN5 system uses a patented high tension wire grid stage to maximize the measurable area on the sample while minimizing the sample sag and flexure.
With the optional high speed Scan In Motion™ (SIM) option, the system can characterize a sample in a fraction of the time a normal scanning would take (as little as 12 minutes, estimated).
GEN SERIES BIREFRINGENCE MEASUREMENT SYSTEM
Specifications |
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|---|---|
| Retardation Range: | 0.005-300nm |
| Max Measurement Rate: | 100 PPS |
| Light Source Wavelength: | 632.8 nm |
| Measurement Area Length: | 1 mm |
| Measurement Area Width: | 1 mm |
Features
- Unprecedented sensitivity in low-level birefringence measurement
- Simultaneous measurement of birefringence magnitude and angle
- Precision repeatability
- High-speed measurement
- No moving parts in the optical system
- Automatic mapping of variable-sized optical elements
- Photoelastic modulator technology
- Simple, user-friendly operation
Applications
- Quality control metrology
- Low-level birefringence measurements of
- Display glass
- LCD
- Large irregular shaped planar glass and plastic
- Plastic film
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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United States
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Frequently Asked Questions
The Exicor GEN Series Birefringence Measurement System is a large format sample measurement unit that uses low level birefringence measurement technology and precision automated motion control elements.
The system can measure display related materials for the LCD industry, such as Generation 5+ compensation films and glass substrates. It can also be adapted to measure other non-display materials like low tech sheeting materials and commercial window glass.
The system offers unprecedented sensitivity in low-level birefringence measurement, simultaneous measurement of birefringence magnitude and angle, precision repeatability, high-speed measurement, no moving parts in the optical system, automatic mapping of variable-sized optical elements, and user-friendly operation.
With the optional high speed Scan In Motion™ (SIM) option, the system can characterize a sample in as little as 12 minutes.
The GEN5 system has a scannable area of 1150 mm x 1375 mm.