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LIGHTSpEED Unpatterned Surface Inspection Solution
Description
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced Synchronous Doppler Detection Technology to capture nanometer scale defects on all kind of wafers. As a part of the modular LIGHTsEE series from UnitySC the LIGHTSpEED can be used as a stand-alone tool or as part of a cluster in combination with other UnitySC technologies such as Phase Shift Deflectometry or brightfield confocal chromatic 2D inspection.
LIGHTSpEED Unpatterned Surface Inspection Solution
Applications
IQC
Process Monitoring
Specialty Substrate
Advanced Packaging
Power
MEMS
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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Ships from:
France
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Sold by:
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On FindLight:
External Vendor
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