Page 2 - Interferometers

MicroEtalons
TecOptics Corp
Fiber optic communication requires extreme miniaturization of optical components. It is for applications such as DWDM (dense wavelength division multiplexing), line narrowing, and channel monitoring that TecOptics introduced its new line of MicroEtalons. Newly developed manufacturing techniques enable TecOptics to supply large ...

Specifications

Interferometer Configuration: Not Specified
Light Source: 632 nm or 633nm, 355nm, 532nm, 780nm, 1053nm, 1064nm, 1550nm, 10.6um, 543nm, 594nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: <0.01 waves
Phase Shifting Fizeau Interferometer in 4\", 5.2\" and 6\" versions

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: 632 nm or 633nm
Output Polarization: Linear
RMS Repeatability: Not Specified
RMS Precision: Not Specified
The XONOX VT1000 DL is a precision interferometer workstations in a feature-rich downward looking tower configurations.  The integrated Fizeau interferometer offers precise surface metrology while the natural granite column with integrated air-bearing facilitates precise radius measurement capability.  The downward looking ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: 632 nm or 633nm
Output Polarization: Linear
RMS Repeatability: Not Specified
RMS Precision: Not Specified
The XONOX VT1200 and VT750 represent precision interferometer workstations in convenient upward looking tower configurations.  The integrated Fizeau interferometer offers precise surface metrology while the natural granite column with integrated air-bearing facilitates precise radius measurement capability.  The workstation ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: 632 nm or 633nm
Output Polarization: Linear
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Interferometer VI-vario 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Interferometer VI-direct SL 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: N/A
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Interferometer VI-direct 10
Vermont Photonics Technologies Corp
Interferometers are an indispensable measurement tool in optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wavefront of optical systems. The interferometers of the VI series are ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Verifire HDX Interferometry For Precise Mid-Spatial Frequency Characterization
Zemetrics
ZYGO\'s new Verifire HDX interferometer is designed and built for mid-spatial frequency content characterization of extreme performance optical components and systems. The system includes all the great features of the popular Verifire HD – such asQPSI, and a long-life stabilized laser – and adds important enhancements ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular, Elliptical, Random
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Verifire HD Interferometer System
Zemetrics
ZYGO\'s Verifire™ HD interferometer system provides fast high-resolution measurements of flat or spherical surfaces, and transmitted wavefront measurement of optical components and assemblies. The interferometric cavity length is precisely modulated while a high-speed camera captures several fringe images, which are analyzed by ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular, Elliptical, Random
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Verifire Fizeau Interferometer
Zemetrics
ZYGO\'s Verifire™ interferometer system provides fast high-precision measurements of plano or spherical surfaces, and transmitted wavefront ofoptical systems and assemblies. Measure glass or plastic optical components – like flats, lenses, and prisms – and even precision machined metal and ceramic surfaces.A true ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: Not Specified
Output Polarization: Circular
RMS Repeatability: Not Specified
RMS Precision: Not Specified
heliOptics WLI6
Heliotis AG
The heliInspetTM H6 has been engineered to meet the specifications of the most demanding 3D in-line inspec-tion tasks such as measuringstep heights, angles, shape, roughness, ripple, waviness, defects, scratches, wear off flatness, coplanarity, deformations film thickness (tomographic mode)Benefitting from Heliotis’ long experience ...

Specifications

Interferometer Configuration: Twyman–Green Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: <0.01 waves
RMS Precision: <0.005 waves
heliInspect H8
Heliotis AG
The new heliInspect™ H8 is the latest addition to Heliotis series of unrivaled optical in-line sensors. At its core, this industry grade White-Light-Interferometer utilizes Heliotis next generation 3D-pixel sensor heliSens™ S4.

Specifications

Interferometer Configuration: Twyman–Green Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Fizeau Interferometers IFV-300 And IFH-300
Armstrong Optical
Newly available from Armstrong Optical are a range of customer-proven phase-measuring Fizeau interferometers with 300mm (12”) aperture in both vertical (downward-looking) and horizontal configurations, IFV-300 and IFH-300. Both configurations are supplied with a certified lambda/20 transmission flat and an ergonomically designed ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: White Light
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
Fizeau Interferometer IFV-60
Armstrong Optical
Newly available from Armstrong Optical is a customer-proven phase-measuring Fizeau interferometer with 60mm aperture in a vertical (downward-looking) configuration, IFV-60. The aperture can also be increased to 100 if required. It is supplied with a certified lambda/20 transmission flat and an ergonomically designed sample handling ...

Specifications

Interferometer Configuration: Fizeau Interferometer
Light Source: White Light
Output Polarization: Linear
RMS Repeatability: Not Specified
RMS Precision: Not Specified
FiBO® 300 is a versatile phase-shifting interferometer for the analysis of fiber optic endface geometry. Measure non-standard, angle-polished and cleaved bare optical fiber with just one click. FiBO makes sophisticated interferometry easy and affordable.

Specifications

Interferometer Configuration: Michelson Interferometer
Light Source: 355nm, 532nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
FiBO® 250 interferometer is a fully automated solution for fast and accurate fiber optic connector endface testing. 3D surface metrology and advanced defect detection capabilities are combined in one compact and portable system.

Specifications

Interferometer Configuration: Michelson Interferometer
Light Source: 532nm, 355nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
NSLI-632-2 N-Slit Laser Interferometer
Interferometric Optics
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes. 

Specifications

Interferometer Configuration: Not Specified
Light Source: 632 nm or 633nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
NSLI-632-1 N-Slit Laser Interferometer
Interferometric Optics
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes. 

Specifications

Interferometer Configuration: Not Specified
Light Source: 632 nm or 633nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
NSLI-594-2 N-Slit Laser Interferometer
Interferometric Optics
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes. 

Specifications

Interferometer Configuration: Not Specified
Light Source: 594nm
Output Polarization: Not Specified
RMS Repeatability: Not Specified
RMS Precision: Not Specified
NSLI-594-1 N-Slit Laser Interferometer
Interferometric Optics
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes.

Specifications

Interferometer Configuration: Not Specified
Light Source: 594nm
Output Polarization: Not Specified
RMS Precision: Not Specified