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Metrology Accessories

The CaliBall II is used in horizontal interferometer set ups and is held in a Zygo type 4” bayonet mount that provides the adjustments to align the CaliBall II to the transmission sphere.     The CaliBall™ II comes with all the same components as CaliBall™ I but it is better suited for use with horizontal looking ...

Specifications

The Calibration Package for PSM is a product offered by Optical Perspectives Group (OPG) that provides a NIST traceable square wave grating with 4 lp/mm spacing for calibrating the lateral scale of the PSM and other optical instruments. The package includes a 64 mm square glass substrate with a 25 mm square chrome square wave line ...

Specifications

Grating Spacing: 4 lp/mm
Glass Substrate Size: 64 mm square
Square Wave Pattern Size: 25 mm square
Calibration Certificate: Included
Calibration Data Sheet: Included
CEO-2D-AD Angular Dispersion
CE Optics Ltd
Once a laser beam suffers from angular dispersion, its spectral components propagate into different directions. Hence, in the focal plane of an objective lens, the focal spot will be enlarged and distorted compared to an angular dispersion-free beam of the same size. The shape of the intensity distribution will be uniquely ...

Specifications

ELWI-GER 3000 2-Dimensional Measurement System
Hofbauer Optik Mess- & Prüftechnik
The ELWIMAT-AKF VIS is an autocollimator with scale display for visual evaluation on a magnifying screen. It is used wherever visual autocollimators with eyepieces have been used so far. It offers a simple and inexpensive way to use an autocollimator in all known applications.        

Specifications

Dispersive Virtual Reference Analyser
Inometrix Inc
The Dispersive Virtual ReferenceTM Analyser, based on our patented Virtual ReferenceTM Interferometer Technology, characterizes chromatic dispersion of short length optical components. This elegant new solution for the high precision characterization of optical channels works with third party tunable laser systems (Agilent/Keysight ...

Specifications

Virtual Reference Analyser
Inometrix Inc
The Virtual Reference™ Analyser is the next generation of chromatic dispersion measurement instruments based on our patented Virtual Reference™ Interferometer Technology. This elegant new solution for the high precision characterization of optical channels works with third party tunable laser systems (Agilent/Keysight ...

Specifications

TrueSurf
TrueGage
Most surface texture gages produced today work quite well, however, many lack the graphics or all of the computing power that you truly need. TrueSurf can make any gage capable of computing all of the latest ASME and ISO parameters. Enhance the capabilities of your low end instruments with TrueSurf software to visualize the profile ...

Specifications

TrueMap v5
TrueGage
A wide variety of instruments are now available for 3D surface measurements. A partial list of these instruments includes stylus profilometers, optical profilometers, scanning probe microscopes (SPMs), laser confocal microscopes, and laser scanning sensors. The best instrument to use quite often depends on the type of surface that is ...

Specifications

TrueMap v6 Beta
TrueGage
A wide variety of instruments are now available for 3D surface measurements. A partial list of these instruments includes stylus profilometers, optical profilometers, scanning probe microscopes (SPMs), laser confocal microscopes, and laser scanning sensors. The best instrument to use quite often depends on the type of surface that is ...

Specifications

highly precise and easy to use system for measuring the diameters of optical elements in both, production and quality inspection environments  designed for long term reliability and cost effective operation

Specifications

Diameter Measurement: 8mm to 140mm
precise and easy to operate measurement system for determining centering errors on lens elements in production, quality inspection or metrology lab environments

Specifications

5.2\" FIZEAU TRANSMISSION SPHERES FOR USING ON 4“ INTERFEROMETERS - PROVIDING EXTENDED MEASURING RANGE Available Sizes: f / 0.7 f / 0.8 f / 1.1 f / 1.6 f / 2.5 f / 4.2 f / 6.4 f / 9.2 f / 5.9D flat

Specifications

heliCam C3 - Fast Lock-in Camera
Heliotis AG
The lock-in camera was originally developed for low coherence interferometry, but the heliSens™ S3.1 sensor and the camera board have found new life with a variety of applications other than OCT, for example, pump-probe spectroscopy. For ease of integration, the Heliotis\' core technology is now available as a rigid camera, capable ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

The BFC™ facilitates endface geometry measurement of cleaved and polished bare optical fiber. Machined aluminum and steel constructions utilize an easy-to-load clam shell design and V-mount groove to prevent damage to fibers during loading. An optional Loading Station* can also be used to assist with sample preparation and alignment. ...

Specifications

Frequently Asked Questions

Metrology accessories are tools and equipment used in conjunction with metrology instruments to improve their performance, accuracy, and functionality.

Common types of metrology accessories include calibration standards, reference artifacts, fixtures and clamps, probe heads and styli, data analysis software, and measurement stands.

Calibration standards are used to verify the accuracy of metrology instruments by providing a known reference value.

Reference artifacts are used as a standard of comparison for metrology instruments, allowing them to be calibrated and verified.

Fixtures and clamps are used to securely hold the object being measured in place, ensuring accurate and repeatable measurements.

Probe heads and styli are used to improve the accuracy and versatility of metrology instruments by allowing measurements to be taken in tight spaces or at awkward angles. They can also be used to measure complex shapes and features that would be difficult or impossible to measure with a standard probe.

There are 20 different Metrology Accessories from suppliers and manufacturers listed in this category. In just a few clicks you can compare different Metrology Accessories with each other and get an accurate quote based on your needs and specifications. Please note that the prices of Metrology Accessories vary significantly for different products based on various factors including technical parameters, features, brand name, etc. Please contact suppliers directly to inquire about the details and accurate pricing information for any product model. Simply navigate to the product page of interest and use the orange button to directly reach out to the respective supplier with one click.

Did You know?

Did you know that metrology accessories are tools and equipment used in conjunction with metrology instruments to improve their performance, accuracy, and functionality? Common types of metrology accessories include calibration standards, reference artifacts, fixtures and clamps, probe heads and styli, data analysis software, and measurement stands. Calibration standards are used to verify the accuracy of metrology instruments, while reference artifacts are used as a standard of comparison for metrology instruments, allowing them to be calibrated and verified. Fixtures and clamps are used to securely hold the object being measured in place, ensuring accurate and repeatable measurements. Probe heads and styli are used to improve the accuracy and versatility of metrology instruments by allowing measurements to be taken in tight spaces or at awkward angles, and to measure complex shapes and features.