Optical Surface Profilers

ContourX-100 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light ...

Specifications

Measurement Technique: N/A
Light Source Type: CW LED, Modulated LED
Light Source Wavelength: -- nm
Sample Reflectivity: 0.05-100%
Vertical Range: 10000000 nm
The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics. By enabling ...

Specifications

Measurement Technique: Confocal Microscopy
Light Source Type: Pulsed LED
Light Source Wavelength: 460 nm
Sample Reflectivity: 1-100%
Vertical Range: 115 nm
OFH has extensive expertise in 3D mapping, distance measurement,  and have worked on LIDAR, stereo imaging, time of flight,  computational photography, light coding, structured illumination, and many more methods. Our clients have sold millions of units and are global leaders in robotic vision.  

Specifications

Light Source Type: Modulated Laser
Light Source Wavelength: 650 nm
Sample Reflectivity: 10-90%
Vertical Range: 10 nm
ContourX-500 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognized advantages of Bruker’s white light interferometry (WLI) floor-standing ...

Specifications

Light Source Type: CW LED, Modulated LED
Light Source Wavelength: -- nm
Sample Reflectivity: 0.05-100%
Vertical Range: 10000000 nm
RMS Repeatability: <0.01 nm
ContourX-200 3D Optical Profilometer
Bruker Nano Surfaces
The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a ...

Specifications

Light Source Type: CW LED, Modulated LED
Light Source Wavelength: -- nm
Sample Reflectivity: 0.05-100%
Vertical Range: 10000000 nm
RMS Repeatability: <0.01 nm
ST400 OPTICAL PROFILER
NANOVEA
The advanced software makes it easy to select zones on screen to be scanned automatically. QC options are available to automate all aspects of testing, including pattern recognition, database communication, macro programs and analysis recipes. Larger X-Y stages, 360° rotational stages and many custom configurations ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: -- nm
Sample Reflectivity: 0-0%
Vertical Range: -- nm
RMS Repeatability: N/A
TMS-150 TopMap Metro.Lab White-Light Interferomter
Polytec GmbH
The TMS-150 TopMap Metro.Lab from Polytec is a precision white-light interferometer with a large vertical measurement range, large field of view and nanometer resolution. The compact 3D workstation easily measures without contact flatness, step height and parallelism of large surfaces and structures on even soft and delicate materials

Specifications

Light Source Type: Pulsed LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 70000000 nm
RMS Repeatability: <0.001 nm
TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts
Polytec GmbH
The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 70000000 nm
RMS Repeatability: <0.01 nm
TMS-350L TopMap In.Line Fast Surface Characterization Setup
Polytec GmbH
The compact design of the TMS-350 TopMap In.Line enables an elegant and easy integration into the production line. The system measures the form deviation, such as flatness or waviness, without contact, reliably and within short cycle times. Since no objectives are needed, collisions and damage to the optics or sample are avoided. The ...

Specifications

Light Source Type: Pulsed LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 500000 nm
RMS Repeatability: <0.001 nm
CVS trevista CAM
STEMMER IMAGING
Trevista CAM closes the gap between simple applications for intelligent cameras and demanding surface inspection tasks. It is based on the patented trevista illumination in combination with a powerful smart camera, pre-loaded witheither Teledyne DALSA\'s Inspect or Sherlock machine vision software. The CVS trevista CAM is ideal ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
CVS trevista FLAT
STEMMER IMAGING
The powerful CVS trevista FLAT takes the trevista dome geometry and reduces it to a flat and compact format. Theillumination controller is integrated into the unit, which makes integration into the inspection system easy andmakes price-sensitive applications possible. Thanks to the flat design, not only the surfaces of ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
Form Talysurf Intra Touch
Spectrum Metrology Ltd
The new Intra Touch from Taylor Hobson - the latest in their range of shopfloor measurement solutions for surface finish, form and optional contour analysis - incorporates the user-friendly Talyprofile software on a touchscreen tablet PC.  

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
Surtronic-R Precision High Speed Roundness Measurement
Spectrum Metrology Ltd
The new Surtronic-R Series is a high speed roundness measurement station which is robust enough for shopfloor but accurate enough for any inspection room.The Surtronic R-80 is ideal for a range of roundness measurement applications including aerospace and automotive engineering: Valves ... Con Rods ... Pins ... Brake Discs .. ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 30 nm
Sample Reflectivity: 1-1%
Vertical Range: 6 nm
RMS Repeatability: <0.01 nm
Form Talysurf Intra Contour
Spectrum Metrology Ltd
This latest portable shop floor contour system in the Form Talysurf range offers a wide range of 32mm to accommodate even the largest features on typical components with enough resolution to detect the smallest contour deviations (120nm) (super precision mode delivers 25nm over a 6.4mm range).  A 20mm range pickup option offers ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 120 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
Taylor Hobson Form Talysurf PGI (Phase Grating Interferometer) - contact stylus profilometer/Equipment measures large sag lens (surfaces form) plastic lenses, small components, IR glass and crystals up to 300mm diameter with high accuracy and it is a number one instrument for optics manufacturers. Following its first release in 1984, ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 2 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
aylor Hobson Stylus Optics Profilometer: Form Talysurf PGI Matrix is an easy to set-up, test and analysis for single or multiple parts. This instrument is perfect optical surface form measurement system for fast and accurate testing of optical components up to 200 mm Diameter. A modular system, adaptable for differing budgets and ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
aylor Hobson\'s Form Talysurf PGI (Phase Grating Interferometer) is a versatile, high resolution 3D  Freeform profilometer for high precision freeform optics measurement. It performs surface finish and form analysis for freefrom optics. Taylor Hobson’s Form Talysurf® PG Freeform is underpinned by ...

Specifications

Light Source Type: Coherent Continuous Wave (CW)
Light Source Wavelength: 800 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm

Frequently Asked Questions

An Optical Surface Profiler is a non-contact metrology tool used to measure surface topography, roughness, and flatness of a sample. It uses light to scan the surface of the sample and create a 3D image of its topography.

Optical Surface Profilers offer high accuracy, repeatability, and resolution in surface measurements. They are non-contact and non-destructive, making them ideal for measuring delicate or fragile surfaces. They can also measure surface features at sub-nanometer scale, making them suitable for research and development applications.

There are several types of Optical Surface Profilers, including white light interferometers, confocal microscopes, and focus variation instruments. Each type has its own strengths and weaknesses, and the choice of the instrument depends on the specific application requirements.

Optical Surface Profilers can measure a wide range of samples, including metals, plastics, ceramics, semiconductors, and biological samples. The sample size can range from a few micrometers to several centimeters, depending on the instrument's measurement range.

The key factors to consider when choosing an Optical Surface Profiler include measurement range, resolution, repeatability, speed, and ease of use. It is important to select an instrument that can provide the required accuracy and precision for the specific application.

Optical Surface Profilers are used in a wide range of applications, including quality control in manufacturing, surface characterization in research and development, failure analysis in materials science, and surface inspection in semiconductor and microelectronics industries.

Optical Surface Profilers offer advantages over other surface metrology techniques such as stylus profilers, atomic force microscopes, and scanning electron microscopes. They offer faster measurement speeds, larger measurement areas, and higher accuracy and repeatability than stylus profilers. They are non-contact and non-destructive, making them more suitable for delicate or fragile samples than atomic force microscopes and scanning electron microscopes.

Optical Surface Profilers: Unlocking Precision and Efficiency in Surface Metrology

Optical Surface Profilers are instrumental in ensuring the quality and precision of surface measurements across a wide range of industries. With advancements in technology, they are becoming more versatile and efficient. This article explores the fundamental aspects, applications, and benefits of Optical Surface Profilers.

What are Optical Surface Profilers?

Optical Surface Profilers are non-contact measurement tools used for analyzing the topography and roughness of surfaces. Through optical techniques like interferometry or focus variation, these devices create detailed 3D maps of a surface. Unlike contact methods, the non-invasive nature of optical profilers preserves the integrity of delicate materials and allows for more accurate data collection.

Types of Optical Surface Profilers

There are several types of Optical Surface Profilers based on different optical techniques:

  1. White Light Interferometry (WLI): Uses the interference of light waves to measure surface topography. Ideal for smooth surfaces.
  2. Confocal Microscopy: Employing a pinhole to eliminate out-of-focus light, this method is well-suited for analyzing steep slopes and varied materials.
  3. Focus Variation: Combines the principles of focus and triangulation, making it suitable for measuring rough surfaces.
  4. Laser Scanning Confocal Microscopy (LSCM): Utilizes laser scanning to achieve high-resolution imaging.

Applications in Various Industries

Optical Surface Profilers serve a diverse range of industries:

  1. Semiconductors: For wafer inspection and surface roughness measurement, ensuring the functionality of microchips.
  2. Automotive: In automotive engineering, they are used for analyzing wear patterns and improving surface textures for enhanced performance.
  3. Biomedical: In biomedical research, these profilers analyze biological samples, helping in diagnostics and drug development.
  4. Manufacturing and Production: Used for quality control, ensuring the precision of machined parts and tools.
  5. Renewable Energy: In the production of solar panels, surface profilers ensure the effective texturing of surfaces for maximum light absorption.

Advancements and Future Prospects

Technological advancements have greatly impacted the capabilities of Optical Surface Profilers. With improved resolution, faster scanning speeds, and automated features, they have become indispensable tools in research and industry. Furthermore, developments in AI and machine learning are paving the way for intelligent analysis, making these devices even more versatile. Looking forward, the integration of Optical Surface Profilers with Industry 4.0 initiatives is likely to enhance productivity and ensure high standards of quality control.

Conclusion

Optical Surface Profilers are essential tools in modern industry and research. Through their non-contact measurement techniques, they offer precise and reliable surface analysis. With a wide range of applications, from the semiconductor industry to biomedical research, Optical Surface Profilers are set to remain at the forefront of technological advancements. As their capabilities continue to evolve, they will play an increasingly integral role in ensuring quality and efficiency in various fields.

Did You know?

Did you know that Optical Surface Profilers are powerful metrology tools used to measure the topography and roughness of surfaces with high accuracy and precision? Optical Surface Profilers use light to create a 3D image of a sample's surface, allowing for non-contact and non-destructive measurements. They offer fast measurement speeds and high-resolution imaging, making them ideal for quality control in manufacturing, surface characterization in research and development, and failure analysis in materials science. Optical Surface Profilers can measure surface features at sub-nanometer scale, making them suitable for a wide range of applications, including microelectronics, optics, and nanotechnology. When selecting an Optical Surface Profiler, it is important to consider factors such as the sample size, measurement range, resolution, and speed to ensure the instrument meets the specific application requirements.