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<0.1nm Optical Surface Profiler

NanoCam Sq Dynamic Surface Profiler
4D Technology Corporation
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NanoCam Sq Dynamic Surface Profiler
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The NanoCam Sq dynamic optical profiler measures surface roughness on supersmooth optics and precision surfaces. The non-contact NanoCam Sq is a vast improvement over the messy replication methods required with traditional workstation optical profilers and provides excellent portability for measuring large optics. By enabling ...

Specifications
Measurement Technique: Confocal Microscopy
Light Source Type: Pulsed LED
Light Source Wavelength: 460 nm
Sample Reflectivity: 1-100%
Vertical Range: 115 nm
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ContourX-200 3D Optical Profilometer
Bruker Nano Surfaces
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ContourX-200 3D Optical Profilometer
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The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a ...

Specifications
Light Source Type: CW LED, Modulated LED
Light Source Wavelength: -- nm
Sample Reflectivity: 0.05-100%
Vertical Range: 10000000 nm
RMS Repeatability: <0.01 nm
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TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts
Polytec GmbH
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TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts
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The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and ...

Specifications
Light Source Type: CW LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 70000000 nm
RMS Repeatability: <0.01 nm
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Form Talysurf Intra Touch
Spectrum Metrology Ltd
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Form Talysurf Intra Touch
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The new Intra Touch from Taylor Hobson - the latest in their range of shopfloor measurement solutions for surface finish, form and optional contour analysis - incorporates the user-friendly Talyprofile software on a touchscreen tablet PC.  

Specifications
Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
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Surtronic-R Precision High Speed Roundness Measurement
Spectrum Metrology Ltd
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Surtronic-R Precision High Speed Roundness Measurement
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The new Surtronic-R Series is a high speed roundness measurement station which is robust enough for shopfloor but accurate enough for any inspection room.The Surtronic R-80 is ideal for a range of roundness measurement applications including aerospace and automotive engineering: Valves ... Con Rods ... Pins ... Brake Discs .. ...

Specifications
Light Source Type: CW LED
Light Source Wavelength: 30 nm
Sample Reflectivity: 1-1%
Vertical Range: 6 nm
RMS Repeatability: <0.01 nm
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Form Talysurf Intra Contour
Spectrum Metrology Ltd
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Form Talysurf Intra Contour
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This latest portable shop floor contour system in the Form Talysurf range offers a wide range of 32mm to accommodate even the largest features on typical components with enough resolution to detect the smallest contour deviations (120nm) (super precision mode delivers 25nm over a 6.4mm range).  A 20mm range pickup option offers ...

Specifications
Light Source Type: CW LED
Light Source Wavelength: 120 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
Data Sheet
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On FindLight marketplace you will find 6 different <0.1nm Optical Surface Profiler from suppliers around the world. With just a few clicks you can compare different <0.1nm Optical Surface Profiler and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.