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CW LED Optical Surface Profiler

TMS-500 TopMap Pro.Surf Surface Characterization System for Precision Parts
Polytec GmbH
The TMS-500 TopMap Pro.Surf and TMS-500-R TopMap Pro.Surf+ are high-precision, non-contact measurement systems with a large field of view for fast and efficient surface characterization of precision parts. Incorporating a traceably calibrated white-light interferometer with large vertical measurement range, TopMap Pro.Surf and ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 525 nm
Sample Reflectivity: 1-1%
Vertical Range: 70000000 nm
RMS Repeatability: <0.01 nm
CVS trevista CAM
STEMMER IMAGING
Trevista CAM closes the gap between simple applications for intelligent cameras and demanding surface inspection tasks. It is based on the patented trevista illumination in combination with a powerful smart camera, pre-loaded witheither Teledyne DALSA\'s Inspect or Sherlock machine vision software. The CVS trevista CAM is ideal ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
CVS trevista FLAT
STEMMER IMAGING
The powerful CVS trevista FLAT takes the trevista dome geometry and reduces it to a flat and compact format. Theillumination controller is integrated into the unit, which makes integration into the inspection system easy andmakes price-sensitive applications possible. Thanks to the flat design, not only the surfaces of ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.001 nm
Form Talysurf Intra Touch
Spectrum Metrology Ltd
The new Intra Touch from Taylor Hobson - the latest in their range of shopfloor measurement solutions for surface finish, form and optional contour analysis - incorporates the user-friendly Talyprofile software on a touchscreen tablet PC.  

Specifications

Light Source Type: CW LED
Light Source Wavelength: -- nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
Surtronic-R Precision High Speed Roundness Measurement
Spectrum Metrology Ltd
The new Surtronic-R Series is a high speed roundness measurement station which is robust enough for shopfloor but accurate enough for any inspection room.The Surtronic R-80 is ideal for a range of roundness measurement applications including aerospace and automotive engineering: Valves ... Con Rods ... Pins ... Brake Discs .. ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 30 nm
Sample Reflectivity: 1-1%
Vertical Range: 6 nm
RMS Repeatability: <0.01 nm
Form Talysurf Intra Contour
Spectrum Metrology Ltd
This latest portable shop floor contour system in the Form Talysurf range offers a wide range of 32mm to accommodate even the largest features on typical components with enough resolution to detect the smallest contour deviations (120nm) (super precision mode delivers 25nm over a 6.4mm range).  A 20mm range pickup option offers ...

Specifications

Light Source Type: CW LED
Light Source Wavelength: 120 nm
Sample Reflectivity: 1-1%
Vertical Range: -- nm
RMS Repeatability: <0.01 nm
On FindLight marketplace you will find 6 different CW LED Optical Surface Profiler from suppliers around the world. With just a few clicks you can compare different CW LED Optical Surface Profiler and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.