Circular Variable Filter 4300 nm – 8100 nm
Description
CI Systems’ Circular Variable Filters (CVF’s) are interference narrow-pass filters of advanced design which are deposited on circular substrates, called segments. Film thickness, and therefore the wavelength of peak transmittance varies linearly and continuously with angular position on the segment. CI Systems CVF’s are ideally suited as monochromators in compact, non-dispersive spectrometers, providing medium-resolution spectral radiation measurements, or when information is desired at a number of specific wavelengths in the relevant spectral range. A CVF can be manufactured in any wavelength range from 0.4µm in the visible region of the spectrum up to 14.3 µm in the infrared. The specific wavelength at which the radiation is transmitted by the segment is selected by appropriately positioning it on the optical beam. A CVF segment rotation, in a way that the beam traces a circumferential path on it, provides a continuous scan of its complete wavelength range. A spectral resolution element size on the CVF varies between one and two millimeters.
Circular Variable Filter 4300 nm – 8100 nm
Specifications |
|
|---|---|
| Attenuator Type: | Absorptive, Reflective |
| Shape: | Round |
| Size: | 2 mm |
| Optical Density: | -- |
Features
Full wavelength scanning from visible to long wave IR.
Successive discrete wavelength selection in the range of the segment.
Allows instrument design flexibility and versatility.
High volume manufacturing.
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
Denmark
-
Sold by:
-
On FindLight:
External Vendor
Claim Delta Optical Thin Film A/S Page to edit and add data
Frequently Asked Questions
A Circular Variable Filter (CVF) is an interference narrow-pass filter that is deposited on a circular substrate, called a segment. The film thickness of the CVF varies linearly and continuously with the angular position on the segment, allowing for continuous scanning of its complete wavelength range.
The CVF can be manufactured in any wavelength range from 0.4µm in the visible region of the spectrum up to 14.3 µm in the infrared.
The key features of the CVF include full wavelength scanning from visible to long wave IR, successive discrete wavelength selection in the range of the segment, instrument design flexibility and versatility, and high volume manufacturing.
The CVF can be positioned on the optical beam to select a specific wavelength at which the radiation is transmitted by the segment. By rotating the CVF segment, a continuous scan of its complete wavelength range can be achieved.
The spectral resolution element size on the CVF varies between one and two millimeters.