PEIR 2000 HR Series Lens
Description
Seiwa PE IR 2000HR Series lens are color corrected from 1000nm-2000nm wavelength. It’s high resolution and high throughput design enables collection of weak signals from samples without re-focusing. In addition, this lens is able to correct 0-700 micron thickness of silicon and glass. Both 20X (NA:0.6) and 50X (NA:0.7) are available.
PEIR 2000 HR Series Lens
Specifications |
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|---|---|
| Magnification: | 50 |
| Numerical Aperture: | 0.7 |
| Focal Length: | 2 mm |
| Working Distance: | 10 mm |
| Design Type: | Not Specified |
| Wavelength Range: | Visible, Near Infrared |
Applications
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United States
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Frequently Asked Questions
The lens is color corrected from 1000nm-2000nm wavelength.
The resolution is calculated as a theoretical based on NA of wavelength 1550 nm. For PE IR 20X 2000 HR, the resolution is 1.6 μm and for PE IR 50X 2000 HR, the resolution is 1.4 μm.
Yes, silicon correction is needed for using the lens. Compensating glass is needed for silicon correction, which is optional.
The working distance of PEIR 50x 2000HR is a provisional value.
The lens is suitable for microscopy, vision, and metrology applications.