Coating Design And Analysis
Description
Helia knows that the key to the success of any process is the planning phase, so it is important to take a customer’s immediate requirements into account, as well as longer term needs. This will include choice of material, material sustainability, real-time data access, storage, handling, environmental exposure, tooling, packaging partners, substrate partners and any third party process steps such as off-site testing. When we receive your substrate, we may perform a detailed visual inspection. At Helia Photonics, specialist personnel use state-of-the-art microscope equipment to examine incoming material. This process is highly adaptable and we work closely with our customers to establish individualized inspection protocols that seamlessly tie in with their production flow. Further, inspection data can immediately be made available via secure online access, allowing for instantaneous yield analysis.
Additionally, digital imaging data can be made available, allowing for comprehensive documentation of every production step. After optical thin film deposition, we undertake post processing analysis of spectrophotometric data to ensure that the required film has been deposited. At Helia we have optical analysis hardware and software coupled with extensive engineering knowledge and experience to ensure that the thin film is as desired. Further to this we also carry out final visual inspection. Different types and areas of components (e.g. laser facets, contact points, etc.) can be inspected both before and after any process as desired by the customer.
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
-
Ships from:
United Kingdom
-
Sold by:
-
On FindLight:
External Vendor
Claim Helia Photonics Ltd Page to edit and add data
Frequently Asked Questions
The visual inspection of the substrate is performed to examine the incoming material and ensure its quality and suitability for the desired process.
The inspection data can be immediately accessed by customers through secure online access, allowing for instantaneous yield analysis.
The post-processing analysis of spectrophotometric data is conducted to ensure that the required thin film has been deposited accurately during the optical thin film deposition process.
Different types and areas of components, such as laser facets and contact points, can be inspected both before and after the process as desired by the customer.
Helia Photonics utilizes optical analysis hardware and software, along with extensive engineering knowledge and experience, to ensure that the thin film meets the desired specifications.