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Page 2 - Spectrophotometers

spectraval 1501 VIS Spectroradiometer
JETI Technische Instrumente GmbH
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spectraval 1501 VIS Spectroradiometer
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spectraval 1501 is a precise and economic reference grade VIS spectroradiometer for various applications including monitor and projector calibration and the measurement of different display types. It measures spectral Radiance in the visible range and provides a variety of integral data. Special versions of the device are ...

Specifications
Wavelength Range (reflectance): 380-780nm
Resolution: 4.5 nm
Minimum Scan Time: -- sec
Data Sheet
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ATAKT V-7HS Spectroradiometer
JADAK, a Novanta Co
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ATAKT V-7HS Spectroradiometer
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The V-7HS is our most sensitive and fastest spectroradiometer, measuring 0.5 cd/m² at 250 ms total measurement time (tested for LED backlit LCD’s). Comparable spectroradiometers can take almost 14 seconds to perform the same task. Featuring a built in CCD target acquisition camera removing the necessity of sighting through ...

Specifications
Wavelength Range (reflectance): 1-1nm
Resolution: -- nm
Minimum Scan Time: 14 sec
Data Sheet
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ILT950 Portable Spectrometer
LOT-QuantumDesign GmbH
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ILT950 Portable Spectrometer
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The ILT950 is equally at home on the production floor as well as in the laboratory combining high performance, accuracy, ease of use, and a wide array of features all in a rugged, compact, portable design. The excellent performance of the ILT950 has been improved further with the addition of a new machined optical bench for ...

Specifications
Wavelength Range (reflectance): 200-1100nm
Resolution: 1.4 nm
Minimum Scan Time: -- sec
Data Sheet
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APE waveScan High Resolution Spectrometer
Applied Physics & Electronics, Inc.
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APE waveScan High Resolution Spectrometer
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waveScan by APE is a compact and cost-efficient optical spectrum analyzer for ultrafast laser systems, delivering rapid measurements at high resolutions. The rotating grating technology achieves high scan rates, making it an ideal real-time alignment tool for mode-locked laser systems. Different configurations, from 200 nm UV to ...

Specifications
Wavelength Range (reflectance): 200 nm-6300nm
Resolution: 0.05 nm
Minimum Scan Time: .167 sec
Input Polarization: Horizontal
Laser Repetition Rate: > 4 MHz (real-time measurements), > 1 kHz (accumulation mode)
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DS2500 Liquid Analyzer
Metrohm USA
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DS2500 Liquid Analyzer
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The DS2500 Liquid Analyzer is the tried and tested, flexible solution for routine analysis of liquids along the entire production chain. Its robust design makes the DS2500 Liquid Analyzer resistant to dust, moisture and vibrations, which means that it is eminently suited for use in harsh production environments. The DS2500 ...

Specifications
Wavelength Range (reflectance): 400-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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NIRS DS2500 Polyol Analyzer
Metrohm USA
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NIRS DS2500 Polyol Analyzer
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Robust, near-infrared spectroscopy for quality control of polyols, not only in laboratories, but also in production environments. The NIRS DS2500 Polyol Analyzer is the tried and tested, flexible solution for quality control and routine analysis of polyols and is compliant with the standards ASTM D6342-12 and ISO 15063:2011. Its ...

Specifications
Wavelength Range (reflectance): 400-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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NIRS DS2500 Petro Analyzer
Metrohm USA
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NIRS DS2500 Petro Analyzer
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The NIRS DS2500 Petro Analyzer is the tried and tested, flexible solution for quality control and routine analysis of fuels and is compliant with the standard ASTM D6122. Resistant to dust, moisture, and vibrations, the NIRS DS2500 Petro Analyzer is not only suitable for laboratory use, but also use in direct production ...

Specifications
Wavelength Range (reflectance): 400-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Optronic Laboratories Inc
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OL 750-NVG AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
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The OL 750-NVG is a specifically configured version of the OL 750 Spectroradiometer for NVG compatibility measurements. This complete turnkey system exceeds the requirements of MIL-L-85762A and incorporates direct viewing imaging optics. An optional built-in photometer is available, and as with all of our spectroradiometers, all ...

Specifications
Wavelength Range (reflectance): 200-30000nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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OL 750 AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
Optronic Laboratories Inc
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OL 750 AUTOMATED SPECTRORADIOMETRIC MEASUREMENT SYSTEM
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The OL 750 is an extremely versatile spectroradiometric measurement system capable of performing a variety of highly accurate optical radiation measurements under computer control in the ultraviolet, visible and infrared. The modular approach of the OL 750, coupled with an extensive selection of accessories and powerful application ...

Specifications
Wavelength Range (reflectance): 280-30000nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
Ibsen Photonics A/S
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
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Ibsen’s PEBBLE spectrometers combine an ultra compact form factor with high resolution and sensitivity as well as environmental ruggedness. PEBBLE VIS is based on the same proven diffraction grating technology used in all other Ibsen spectrometers. This ensures that PEBBLE can be manufactured in high quantities with very small ...

Specifications
Wavelength Range (reflectance): 360-830nm
Resolution: 6 nm
Minimum Scan Time: - sec
Data Sheet
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SM303 TE Cooled Back-Thinned CCD Spectrometer
Spectral Products
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SM303 TE Cooled Back-Thinned CCD Spectrometer
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Spectral Products is offering the new SM303 TE cooled back-thinned 1024 pixel array CCD spectrometer. The SM303 is ideal for UV/VIS/NIR spectrometry that requires very high signal to noise ratio and/or high dynamic range, like fluorescence, Rama, LED property testing applications. The back-thinned CCD has excellent sensitivity in UV ...

Specifications
Wavelength Range (reflectance): 200-1100nm
Resolution: 10 nm
Minimum Scan Time: 0,07 sec
Data Sheet
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SM445 Preconfigured High Resolution CCD Spectrometer
Spectral Products
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SM445 Preconfigured High Resolution CCD Spectrometer
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The SM445 is a new compact design CCD Spectrometer for use with a PC. Based on SP\'s special optical bench design, it supports many different applications where spectral or color measurements are required, including high dynamic range applications. The SM445 can accept light directly through its built in slit or via optical fiber. ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 0.01 sec
Data Sheet
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SM245 Highspeed CCD Spectrometer
Spectral Products
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SM245 Highspeed CCD Spectrometer
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Spectral Products is offering the new SM245 high speed 2048 pixel array CCD spectrometer. Thanks to the enhanced design on the electronic board of the SM245, the dark current noise level as well as the data acquisition speed have improved. Based on SP\'s special optical bench design, it supports many different applications where ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 1 sec
Data Sheet
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FilmTek 2000 SE
Scientific Computing International
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FilmTek 2000 SE
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The FilmTek™ 2000 SE benchtop metrology system provides unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. It is ideally suited for academic and R&D settings. The FilmTek™ 2000 SE combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry to ...

Specifications
Wavelength Range (reflectance): 240-1700nm
Resolution: 0.3 nm
Minimum Scan Time: 2 sec
Data Sheet
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FilmTek 2000 PAR
Scientific Computing International
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FilmTek 2000 PAR
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The FilmTek™ 2000 PAR is a low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. This system combines patented DUV-NIR reflectometry with wafer auto-loader and pattern recognition to deliver unmatched metrology performance at this price point. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 0.2 sec
Data Sheet
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FilmTek 2000 PAR-SE
Scientific Computing International
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FilmTek 2000 PAR-SE
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The FilmTek™ 2000 PAR-SE combined metrology line is our most advanced benchtop metrology solution, with the highest accuracy, precision, and versatility in the industry. The FilmTek™ 2000 PAR-SE was engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 1 sec
Data Sheet
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SpectrOil M/C-W
Wilks - a Spectro Scientific Co
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SpectrOil M/C-W
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Originally designed for military applications in the mid 1990s, the SpectrOil M is the only in service oil analysis spectrometer approved by the US Department of Defense (DoD) Joint Oil Analysis Program (JOAP). Since its development, the SpectrOil M has been the industry standard for reliable, deployable spectrometers that perform ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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SpectrOil 110E
Wilks - a Spectro Scientific Co
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SpectrOil 110E
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The SpectrOil 100 Rotating Disc Electrode Optical Emission Spectrometer (RDE-OES) is the eighth generation of the market leading RDE elemental spectrometer. It is widely used in commercial oil laboratories, on-site or trailer labs, as a proven means of precisely determining elemental composition in lubricating oil, coolant, light or ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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UltraPath 380 nm - 730 nm UPVIS
WPI
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UltraPath 380 nm - 730 nm UPVIS
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 380-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
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UltraPath 250 nm - 730 nm UPUV
WPI
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UltraPath 250 nm - 730 nm UPUV
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 250-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
Inquire Price