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Page 3 - Spectrophotometers

Agilent Cary 5000 UV-Vis-NIR Grating Spectrophotometer
Optical Data Associates LLC
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Agilent Cary 5000 UV-Vis-NIR Grating Spectrophotometer
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This system was acquired new in 2018 and is basically the same as the system described above, with upgraded electronics. This provides ODA with a new flagship system to back up the Cary 5000. The much older Cary 500 could no longer be maintained and was surplused. This instrument is usually configured with the Agilent ...

Specifications
Wavelength Range (reflectance): 250-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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Agilent Cary 7000 UV-Vis-NIR Grating Spectrophotometer
Optical Data Associates LLC
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Agilent Cary 7000 UV-Vis-NIR Grating Spectrophotometer
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n 2013, ODA was the first US company to acquire the Agilent Universal Measurement Accessory [UMA]. which converts the Agilent Cary 5000 UV-Vis-NIR SPM described below into the Agilent Cary 7000 system. ODA was involved in the development of the system during two visits to the factory in Melbourne, Australia and served as a beta site ...

Specifications
Wavelength Range (reflectance): 250-2500nm
Resolution: -- nm
Minimum Scan Time: -- sec
Data Sheet
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
Ibsen Photonics A/S
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PEBBLE VIS 360 - 830 nm OEM Spectrometer
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Ibsen’s PEBBLE spectrometers combine an ultra compact form factor with high resolution and sensitivity as well as environmental ruggedness. PEBBLE VIS is based on the same proven diffraction grating technology used in all other Ibsen spectrometers. This ensures that PEBBLE can be manufactured in high quantities with very small ...

Specifications
Wavelength Range (reflectance): 360-830nm
Resolution: 6 nm
Minimum Scan Time: - sec
Data Sheet
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Handheld VNIR Spectrometer PSR-1100
SphereOptics GmbH
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Handheld VNIR Spectrometer PSR-1100
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Using Spectral evolutions smallest and lightest VNIR spectroscopy for non-destructive sampling, the PSR-1100(-F) is designed for truly portable, real-time measurements in the field. The SE spectrometer provides quickly derived precision reflectance, radiance, and irradiance spectra in a variety of environments. The PSR-1100 series ...

Specifications
Wavelength Range (reflectance): 320-1100nm
Resolution: 3.0 nm
Minimum Scan Time: 0.008-2 sec
Data Sheet
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Spectral Evolution Fieldspectrometers PSR+ 3500
SphereOptics GmbH
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Spectral Evolution Fieldspectrometers PSR+ 3500
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The Spectral Evolution PSR(+) series of spectroradiometers provides the best spectral resolution available in a portable, ruggedized spectroradiometer. The new line of field spectroradiometers offers dramatically improved radiometric performance in the SWIR 1 and 2 regions by using advanced TE-cooled detector arrays. The upgraded ...

Specifications
Wavelength Range (reflectance): 350-2500nm
Resolution: 8 nm
Minimum Scan Time: 0.001 sec
Data Sheet
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SR-6500 Ultra High Resolution Spectrometer
SphereOptics GmbH
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SR-6500 Ultra High Resolution Spectrometer
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The SR-6500 portable spectroradiometer from SPECTRAL EVOLUTION provides the ultimate in high resolution NIR spectroscopy. With a 350-2500nm spectral range, it features stable performance with three high density thermoelectrically-cooled photodiode arrays and NIST-traceable radiometric calibration.  

Specifications
Wavelength Range (reflectance): 350-2500nm
Resolution: 3.8 nm
Minimum Scan Time: -- sec
Data Sheet
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T7 UV/VIS Spectrophotometer
Spectrolab Systems
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T7 UV/VIS Spectrophotometer
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UV-Visible Spectrophotometer is a well-accepted, documented technique with many applications. The technique is extensively used for the analysis of foods, drugs, agricultural products and is widely used in the medical care, public health, environmental protection, life sciences industries and many other organic and biochemical ...

Specifications
Wavelength Range (reflectance): 190-1100nm
Resolution: 0.2 nm
Minimum Scan Time: -- sec
Data Sheet
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T6V UV/VIS Spectrophotometer
Spectrolab Systems
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T6V UV/VIS Spectrophotometer
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We have developed its latest Spectrophotometer, the T6, based on advanced technology. The advanced modular design ensures outstanding performance combined with quality and an excellent specification. The T6 provides the functionality of an advanced instrument, at an affordable price. The superior flexibility, high level of automation ...

Specifications
Wavelength Range (reflectance): 325-1100nm
Resolution: 2 nm
Minimum Scan Time: -- sec
Data Sheet
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T6U UV/VIS Spectrophotometer
Spectrolab Systems
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T6U UV/VIS Spectrophotometer
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We have developed its latest Spectrophotometer, the T6, based on advanced technology. The advanced modular design ensures outstanding performance combined with quality and an excellent specification. The T6 provides the functionality of an advanced instrument, at an affordable price. The superior flexibility, high level of automation ...

Specifications
Wavelength Range (reflectance): 190-1100nm
Resolution: 2 nm
Minimum Scan Time: -- sec
Data Sheet
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SM303 TE Cooled Back-Thinned CCD Spectrometer
Spectral Products
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SM303 TE Cooled Back-Thinned CCD Spectrometer
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Spectral Products is offering the new SM303 TE cooled back-thinned 1024 pixel array CCD spectrometer. The SM303 is ideal for UV/VIS/NIR spectrometry that requires very high signal to noise ratio and/or high dynamic range, like fluorescence, Rama, LED property testing applications. The back-thinned CCD has excellent sensitivity in UV ...

Specifications
Wavelength Range (reflectance): 200-1100nm
Resolution: 10 nm
Minimum Scan Time: 0,07 sec
Data Sheet
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SM445 Preconfigured High Resolution CCD Spectrometer
Spectral Products
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SM445 Preconfigured High Resolution CCD Spectrometer
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The SM445 is a new compact design CCD Spectrometer for use with a PC. Based on SP\'s special optical bench design, it supports many different applications where spectral or color measurements are required, including high dynamic range applications. The SM445 can accept light directly through its built in slit or via optical fiber. ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 0.01 sec
Data Sheet
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SM245 Highspeed CCD Spectrometer
Spectral Products
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SM245 Highspeed CCD Spectrometer
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Spectral Products is offering the new SM245 high speed 2048 pixel array CCD spectrometer. Thanks to the enhanced design on the electronic board of the SM245, the dark current noise level as well as the data acquisition speed have improved. Based on SP\'s special optical bench design, it supports many different applications where ...

Specifications
Wavelength Range (reflectance): 200-1050nm
Resolution: 10 nm
Minimum Scan Time: 1 sec
Data Sheet
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FilmTek 2000 SE
Scientific Computing International
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FilmTek 2000 SE
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The FilmTek™ 2000 SE benchtop metrology system provides unmatched measurement performance, versatility, and speed for unpatterned thin to thick film applications. It is ideally suited for academic and R&D settings. The FilmTek™ 2000 SE combines spectroscopic ellipsometry and DUV multi-angle polarized reflectometry to ...

Specifications
Wavelength Range (reflectance): 240-1700nm
Resolution: 0.3 nm
Minimum Scan Time: 2 sec
Data Sheet
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FilmTek 2000 PAR
Scientific Computing International
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FilmTek 2000 PAR
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The FilmTek™ 2000 PAR is a low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. This system combines patented DUV-NIR reflectometry with wafer auto-loader and pattern recognition to deliver unmatched metrology performance at this price point. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 0.2 sec
Data Sheet
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FilmTek 2000 PAR-SE
Scientific Computing International
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FilmTek 2000 PAR-SE
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The FilmTek™ 2000 PAR-SE combined metrology line is our most advanced benchtop metrology solution, with the highest accuracy, precision, and versatility in the industry. The FilmTek™ 2000 PAR-SE was engineered to meet the needs of nearly any advanced thin film measurement application, from R&D to production. The ...

Specifications
Wavelength Range (reflectance): 190-1700nm
Resolution: 0.3-2 nm
Minimum Scan Time: 1 sec
Data Sheet
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SpectrOil M/C-W
Wilks - a Spectro Scientific Co
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SpectrOil M/C-W
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Originally designed for military applications in the mid 1990s, the SpectrOil M is the only in service oil analysis spectrometer approved by the US Department of Defense (DoD) Joint Oil Analysis Program (JOAP). Since its development, the SpectrOil M has been the industry standard for reliable, deployable spectrometers that perform ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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SpectrOil 110E
Wilks - a Spectro Scientific Co
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SpectrOil 110E
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The SpectrOil 100 Rotating Disc Electrode Optical Emission Spectrometer (RDE-OES) is the eighth generation of the market leading RDE elemental spectrometer. It is widely used in commercial oil laboratories, on-site or trailer labs, as a proven means of precisely determining elemental composition in lubricating oil, coolant, light or ...

Specifications
Wavelength Range (reflectance): 203-810nm
Resolution: -- nm
Minimum Scan Time: 30 sec
Data Sheet
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UltraPath 380 nm - 730 nm UPVIS
WPI
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UltraPath 380 nm - 730 nm UPVIS
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 380-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
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UltraPath 250 nm - 730 nm UPUV
WPI
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UltraPath 250 nm - 730 nm UPUV
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UltraPath™ is a unique high-performance spectrophotometer system offering userselectable optical path lengths of 2, 10, 50 and 200 cm. The instrument operates in the wavelength range of 250 to 730 (UPUV) or 380 to 730 nm (UPVIS) and has an exceptional dynamic range. Designed for the detection of low absorbing species in aqueous ...

Specifications
Wavelength Range (reflectance): 250-730nm
Resolution: 5 nm
Minimum Scan Time: -- sec
Data Sheet
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OLIS CLARiTY VF Spectrophotometer
OLIS Inc
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OLIS CLARiTY VF Spectrophotometer
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The CLARiTY VF capitalizes on 50 years of efforts employing integrating cavities. This spectrophotometer has performance characteristics which allow you to study samples in their native or near-native state.  Employs tungsten & deuterium lamps as the excitation source and a single grating monochromator with sensitive, ...

Specifications
Wavelength Range (reflectance): 230-870nm
Resolution: 0.125 nm
Minimum Scan Time: 0.01 sec
Data Sheet
Inquire Price