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X-Ray Fluorescence Spectroscopy

Soft X-ray Emission Spectrometer For EPMA And FE-SEM
JEOL USA Inc
JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays). These new Soft X-ray Emission Spectrometers (SXES) boast not only high spectral resolution (0.3eV) which ...

Specifications

Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-10ppm
Resolution: 0.3 eV
ElementEye JSX-1000S XRF
JEOL USA Inc
An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed. The ...

Specifications

Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
NEX LS Process energy dispersive XRF (EDXRF) spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Featuring advanced third generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications.Energy dispersive X-ray fluorescence (EDXRF)To deliver superior analytical performance and reliability, the ...

Specifications

Measurement Type: Chemical identification
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX XT Total Sulfur Process Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku\'s NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums. On-Line total sulfur gaugeThis versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is ...

Specifications

Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX OL Process Elemental Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Featuring advanced 3rd generation energy dispersive X-ray fluorescence (EDXRF) technology, the Rigaku NEX OL represents the next evolution of process elemental analysis for liquid stream and fixed position web or coil applications. Designed to span from heavy industrial through to food grade process gauging solutions, the NEX OL is ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX CG - Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards: Analyze ₁₁Na to ₉₂U non-destructivelySolids, liquids, powders and thin filmsPolarized excitation for lower detection limitsNovel treatment of peak overlap reduces ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX DE VS Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
As a premium high performance, SMALL SPOT benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX DE Energy Dispersive X-ray Fluorescence Spectrometer
Applied Rigaku Technologies Inc Div of Rigaku Corp
As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the new Rigaku NEX DE delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX QC+ QuantEZ - Energy Dispersive X-ray Fluorescence
Applied Rigaku Technologies Inc Div of Rigaku Corp
Windows®-based EDXRF for rapid elemental analysisAs a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX QC - Energy Dispersive X-ray Fluorescence Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types: Analyze ₁₁Na to ₉₂U non-destructivelySolids, liquids, alloys, powders and thin films50kV X-ray tube for wide elemental ...

Specifications

Measurement Type: Elemental analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
NEX QC MFA - Marine Fuel Sulfur Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid quantitative determination of sulfur in a wide variety of marine fuels: Analyze sulfur (S) non-destructively down to low ppm levelsAnalyze nickel (Ni), vanadium (V) and iron (Fe) if neededAnalyze for zinc (Zn) to determine if fuel has been ...

Specifications

Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
There are 11 different X-Ray Fluorescence Spectroscopy from suppliers and manufacturers listed in this category. In just a few clicks you can compare different X-Ray Fluorescence Spectroscopy with each other and get an accurate quote based on your needs and specifications. Please note that the prices of X-Ray Fluorescence Spectroscopy vary significantly for different products based on various factors including technical parameters, features, brand name, etc. Please contact suppliers directly to inquire about the details and accurate pricing information for any product model. Simply navigate to the product page of interest and use the orange button to directly reach out to the respective supplier with one click.