All Categories
Spectroscopy Solutions

FILTER PRODUCTS

to
  1. Home
  2. Spectral Analysis
  3. Spectroscopy Solutions
  4. X-Ray Fluorescence Spectroscopy
  5. Contaminant detection and analysis

Contaminant detection and analysis X-Ray Fluorescence Spectroscopy

GOLDSCOPE SD 520 Spectrometer
Fischer Technology Inc
Add to watch list
GOLDSCOPE SD 520 Spectrometer
Compare
Not all that glitters is gold – much less pure gold! If you want to know exactly how much gold it contains, you can rely on our X-ray fluorescence (XRF) measuring instruments: With the GOLDSCOPE SD® you can quickly check the authenticity of jewelry and analyze the composition of gold and precious metals – non-destructively. The ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: 25000 eV
Data Sheet
Inquire Price
FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
Fischer Technology Inc
Add to watch list
FISCHERSCOPE X-RAY XUL AND XULM Spectrometer
Compare
The FISCHERSCOPE® X-RAY XUL® series is truly fundamental equipment for every electroplating shop. These straightforward and affordable energy dispersive X-ray fluorescence XRF analyzers are excellent for monitoring the bath composition, but they’re also indispensable helpers when it comes to quality control: robust and perfectly ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Inquire Price
FISCHERSCOPE X-RAY XAN Spectrometer
Fischer Technology Inc
Add to watch list
FISCHERSCOPE X-RAY XAN Spectrometer
Compare
Like the XUL series, the XRF spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze ...

Specifications
Measurement Type: Contaminant detection and analysis, Chemical identification, Other
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Inquire Price
Soft X-ray Emission Spectrometer For EPMA And FE-SEM
JEOL USA Inc
Add to watch list
Soft X-ray Emission Spectrometer For EPMA And FE-SEM
Compare
JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays). These new Soft X-ray Emission Spectrometers (SXES) boast not only high spectral resolution (0.3eV) which ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-10ppm
Resolution: 0.3 eV
Data Sheet
Inquire Price
ElementEye JSX-1000S XRF
JEOL USA Inc
Add to watch list
ElementEye JSX-1000S XRF
Compare
An easy-to-use, smart solution for high-sensitivity elemental analysis, this benchtop ED-XRF spectrometer analyzes major to trace components on most sample types - solids, powders, liquids - with little or no sample preparation. The ElementEye easily complements SEM, EPMA, NMR, and mass spectrometry analyses when needed. The ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1ppm
Resolution: -- eV
Data Sheet
Inquire Price
Axios FAST
ASD Inc Div of Malvern Panalytical Inc
Add to watch list
Axios FAST
Compare
Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
Inquire Price
2830 ZT Advanced semiconductor thin film metrology solution
ASD Inc Div of Malvern Panalytical Inc
Add to watch list
2830 ZT Advanced semiconductor thin film metrology solution
Compare
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-1000000ppm
Resolution: 35 eV
Data Sheet
Inquire Price
Epsilon 4 Fast and accurate at-line elemental analysis
ASD Inc Div of Malvern Panalytical Inc
Add to watch list
Epsilon 4 Fast and accurate at-line elemental analysis
Compare
Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
Inquire Price
Epsilon 1 Small, powerful and portable XRF analyzer
ASD Inc Div of Malvern Panalytical Inc
Add to watch list
Epsilon 1 Small, powerful and portable XRF analyzer
Compare
Small, powerful and portable XRF analyzerThe Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances in excitation and detection technology the Epsilon 1 is a star performer in the low-cost benchtop instrument ...

Specifications
Measurement Type: Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
Data Sheet
Inquire Price
Zetium XRF
ASD Inc Div of Malvern Panalytical Inc
Add to watch list
Zetium XRF
Compare
Scientifically-sound, benefits-driven innovations achieved with SumXcore technology - an integration of WDXRF, EDXRF and XRD - incorporated into the Zetium platform provide ultimate flexibility, performance and versatility and are on track to revolutionize the world of XRF.

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
Inquire Price
NEX XT Total Sulfur Process Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Add to watch list
NEX XT Total Sulfur Process Analyzer
Compare
Rigaku\'s NEX XT is the next generation process gauge for high-level total sulfur measurement (0.02% to 6% S) of crude, bunker fuel, fuel oils, and other highly viscous hydrocarbons, including residuums. On-Line total sulfur gaugeThis versatile, compact and robust X-ray Transmission / Absorption (XRT / XRA) process gauge is ...

Specifications
Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
Inquire Price
NEX QC MFA - Marine Fuel Sulfur Analyzer
Applied Rigaku Technologies Inc Div of Rigaku Corp
Add to watch list
NEX QC MFA - Marine Fuel Sulfur Analyzer
Compare
Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer delivers rapid quantitative determination of sulfur in a wide variety of marine fuels: Analyze sulfur (S) non-destructively down to low ppm levelsAnalyze nickel (Ni), vanadium (V) and iron (Fe) if neededAnalyze for zinc (Zn) to determine if fuel has been ...

Specifications
Measurement Type: Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 00-00ppm
Resolution: N/A eV
Data Sheet
Inquire Price
On FindLight marketplace you will find 12 different Contaminant detection and analysis X-Ray Fluorescence Spectroscopy from suppliers around the world. With just a few clicks you can compare different Contaminant detection and analysis X-Ray Fluorescence Spectroscopy and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.