Soft X-ray Emission Spectrometer For EPMA And FE-SEM
Description
JEOL has developed an unprecedented new type of wavelength dispersive spectrometer (WDS) that utilizes a variable space grating, allowing the efficient and parallel collection of very low energy-rays (so called “soft” X-rays). These new Soft X-ray Emission Spectrometers (SXES) boast not only high spectral resolution (0.3eV) which allows for the Nitrogen Kα and Titanium Lℓ line to be resolved with a separation of only 1.78eV, but also ultra-low energy, low-concentration sensitivity with the capability to detect Li even at low single digit weight percent concentration. An additional, and maybe its strongest asset, is its ability to do chemical state analysis. The spectrometer detects differences between conduction band and valence band electrons when they emit X-rays allowing the distinction between bonding and crystal structure in samples containing the same elements. An example would be differentiating highly ordered pyrolytic graphite vs. diamond vs. amorphous C, all of which are made only of carbon.
Soft X-ray Emission Spectrometer For EPMA And FE-SEM
Specifications |
|
|---|---|
| Measurement Type: | Elemental analysis, Contaminant detection and analysis |
| Lowest Level Detection (LLD) Range: | 1-10ppm |
| Resolution: | 0.3 eV |
Features
- Excellent light element detection (suitable for Li)
- Ideal for chemical state analysis of light elements – critical for battery research
- Superb sensitivity - a few 10s of ppm B in steel
- Energy range 50eV – 210eV (even 2nd and 3rd order lines have a high P/B ratio and high resolution)
- Extreme spectral resolution 0.3eV Al-L fermi edge
- No moving parts, resulting in high stability and reproducibility
- Part of an integrated analytical system or as a stand-alone detector
- Easy to use spectral mapping
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
United States
-
Sold by:
-
On FindLight:
External Vendor
Claim JEOL USA Inc Page to edit and add data
Frequently Asked Questions
The Soft X-ray Emission Spectrometer is used for wavelength dispersive spectrometry, chemical state analysis, and detecting differences in bonding and crystal structure in samples containing the same elements.
The Soft X-ray Emission Spectrometer has a spectral resolution of 0.3eV, allowing for the resolution of specific X-ray lines with a separation of only 1.78eV.
Yes, the Soft X-ray Emission Spectrometer has excellent light element detection capabilities, making it suitable for detecting elements like lithium.
No, the Soft X-ray Emission Spectrometer does not have any moving parts, resulting in high stability and reproducibility.
The Soft X-ray Emission Spectrometer has an energy range of 50eV to 210eV, allowing for the detection of various X-ray lines and high-resolution analysis.