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Thin film metrology X-Ray Fluorescence Spectroscopy

Axios FAST
ASD Inc Div of Malvern Panalytical Inc
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Axios FAST
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Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
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2830 ZT Advanced semiconductor thin film metrology solution
ASD Inc Div of Malvern Panalytical Inc
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2830 ZT Advanced semiconductor thin film metrology solution
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The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis, Chemical identification
Lowest Level Detection (LLD) Range: 0.1-1000000ppm
Resolution: 35 eV
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Epsilon 4 Fast and accurate at-line elemental analysis
ASD Inc Div of Malvern Panalytical Inc
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Epsilon 4 Fast and accurate at-line elemental analysis
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Built on the experience and success of the proven Epsilon 3 range of XRF spectrometers, the Epsilon 4 is a multi-functional benchtop XRF analyzer for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection ...

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 1-1000000ppm
Resolution: 135 eV
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Zetium XRF
ASD Inc Div of Malvern Panalytical Inc
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Zetium XRF
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Scientifically-sound, benefits-driven innovations achieved with SumXcore technology - an integration of WDXRF, EDXRF and XRD - incorporated into the Zetium platform provide ultimate flexibility, performance and versatility and are on track to revolutionize the world of XRF.

Specifications
Measurement Type: Thin film metrology, Elemental analysis, Contaminant detection and analysis
Lowest Level Detection (LLD) Range: 0.1-100ppm
Resolution: 35 eV
Data Sheet
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On FindLight marketplace you will find 4 different Thin film metrology X-Ray Fluorescence Spectroscopy from suppliers around the world. With just a few clicks you can compare different Thin film metrology X-Ray Fluorescence Spectroscopy and get accurate price quotes based on your needs and quantity required. Note that some wholesale suppliers may offer discounts for large quantities. From any product page you can directly contact any vendor within seconds.