TeraSpectra: A terahertz spectrometer
Description
ARP’s Terahertz Spectrometer, TeraSpectra is a turn key spectrometer system, that allows time domain measurements to be conducted over a time span of sub-Pico seconds to a few tens of Pico-seconds with an equivalent frequency range of 0.1 to ~30 THz.
This wide range allows characterizing a number of molecular events important in semiconductor and nano-material research and inspection.
TeraSpectra: A terahertz spectrometer
Specifications |
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|---|---|
| System Repetition Rate: | N/A MHz |
| Scan Rate: | N/A KHz |
| Spectral Range: | >=30 THz |
Features
- Turn-key System
- 3-Dimensional Imaging
- Sub-Surface Inspection
- Non-Contact
- Non-Destructive
- Layer-by-Layer Analysis
Applications
Material Characterization:
- Lattice Image
- Stacking Fault
- Dislocations
- Nanovoids
- Delamination
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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How to order?
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Ships from:
United States
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
TeraSpectra is used for material characterization such as lattice image stacking fault dislocations, nanovoids, and delamination.
TeraSpectra is a turn-key system that offers 3-dimensional imaging, sub-surface inspection, non-contact non-destructive layer-by-layer analysis.
TeraSpectra is a terahertz spectrometer that allows time domain measurements to be conducted over a time span of sub-Pico seconds to a few tens of Pico-seconds with an equivalent frequency range of 0.1 to ~30 THz.
TeraSpectra allows characterizing a number of molecular events important in semiconductor and nano-material research and inspection.
TeraSpectra has an equivalent frequency range of 0.1 to ~30 THz.