maxLIGHT - VUV / XUV / X-ray Spectrometer
Description
maxLIGHT pro
high-efficiency spectrometer
- flat-field grazing-incidence spectrometer
- highest efficiency due to proprietary no-slit design
- wavelength range from 1 to 200 nm
- integrated beamprofiler
- modular, turn-key design
maxLIGHT offers maximum light collection and the highest efficiency in the industry due to its no-slit design. Aberration-corrected flat-field wavelength coverage spans 1nm to 200nm with extensive spectral bandwidths, e. g. 5-80nm per individual grating.
The modular design matches a variety of experimental geometries and configurations. maxLIGHT features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.
Detector options include both XUV CCDs for highest resolution and dynamic range, and MCP/CMOS detectors for broadest wavelength coverage and gated / intensified detection. Please contact us to discuss your needs.
Customized derivatives of our maxLIGHT spectrometer are also available.
No-slit design
The proprietary spectrometer design by HP Spectroscopy uses direct source imaging. Consequently, a narrow entrance slit is not needed and light collection is maximized. Comparing with traditional spectrometer architectures, a factor of 20 more light reaches the spectrometer detector. The architecture also greatly increases day-to-day operation robustness.
maxLIGHT - VUV / XUV / X-ray Spectrometer
Specifications |
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|---|---|
| Monochromator Type: | Flat Field Grazing Incidence |
| Effective Focal Length: | 200-infinity mm |
| Diffraction Grating: | various lines/mm |
| Grating Blaze Wavelength: | various nm |
| Spectral Range: | 1-200nm |
| Linear Dispersion (Avg): | 0.2 - 1.6 nm/mm |
| Spectral Resolution (Avg): | 0.015 - 0.05 nm |
Features
Direct imaging of the source
- flat-field spectrometer for the 1 to 200nm spectral range
- best-in-class efficiency through no-slit design: no need for an alignment-sensitive narrow entrance slit
- ~20x more light collection than standard spectrometers, resulting in a proportional improvement of the signal-to-noise
Accuracy and efficiency
- absolute grating position monitoring for maintaining grating alignment
- highly efficient aberration-corrected flat-field grating
- integrated beamprofiler
- double stray-light filter
- convenient control by software
Customization
- every spectrometer is customized to exactly match the desired application, e.g.
- interfacing to experimental chambers
- specific device geometries
- user-defined filter mounts
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
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Ships from:
Germany
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Sold by:
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On FindLight:
since 2015
Frequently Asked Questions
Yes, every spectrometer by HP Spectroscopy can be customized to exactly match the desired application, e.g. interfacing to experimental chambers, adaption of the source distance, integration of customer-supplied detectors, user-defined filter mounts.
The maxLIGHT XUV spectrograph provides approx. 20 times more light collection than standard versions, resulting in a signal-to-noise figure improved by the same ratio.
Yes, the spectrometer can be used without entrance slit to maximize light collection.
The maxLIGHT XUV spectrograph features an aberration-corrected flat-field wavelength coverage from 1nm to 200nm.
The operating pressure of the maxLIGHT XUV spectrograph is less than 1E-6mbar (UHV version available).