ASD Inc Div of Malvern Panalytical Inc
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Frequently Asked Questions

XRF spectroscopy offers exceptional precision and sensitivity for the simultaneous determination of layer thickness and composition, and is compatible with a broad range of applications.

The 2830 ZT Wafer Analyzer is used for measuring film thickness and composition in the semiconductor and data storage industry.

The FALMO-2G is a carrier loading system that easily integrates into any lab or fab and supports various configurations, including FOUP, SMIF, or open cassette load ports.

ZETA technology is a groundbreaking technology that eliminates the effects of X-ray tube aging, ensuring that rapid analysis and short measurement times are upheld throughout the tube’s lifetime.

The 2830 ZT is supplied with the advanced SuperQ software, which includes FP Multi, the software package specifically designed for multi-layer analysis.

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