FISCHERSCOPE X-RAY XAN Spectrometer
Description
Like the XUL series, the XRF spectrometer FISCHERSCOPE® X-RAY XAN® are ideally suited for analyzing simply shaped samples. However, a great advantage of the XAN series lies in their high-quality semiconductor detectors. And X-ray fluorescence (XRF) allows you not only to measure the thickness of coatings but also to analyze the composition of alloys (e. g. copper). In total, the XAN series comprises 5 bench-top XRF spectrometers that cover a wide range of applications. The XAN 215 has a cost-effective PIN detector. It’s ideal for simple coating thickness tasks, e.g. zinc on iron or Au/Ni/Cu. For more complex applications with alloys or precious metals, we recommend our XRF devices with a silicon drift detector (e.g. the XAN 220): Due to its much higher resolution, it can reliably distinguish between gold and platinum. And when you need to detect traces of heavy metals and other hazardous substances, the XAN 250 is your solution.
FISCHERSCOPE X-RAY XAN Spectrometer
Specifications |
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|---|---|
| Measurement Type: | Contaminant detection and analysis, Chemical identification, Other |
| Lowest Level Detection (LLD) Range: | 1-1ppm |
| Resolution: | -- eV |
Features
Universal X-ray fluorescence (XRF) spectrometers for metal and precious-metal analysis, coating thickness measurement and RoHS screening according to DIN ISO 3497 and ASTM B 568
Premium semiconductor detectors (PIN and SDD) ensure excellent detection accuracy and high resolution
XAN 250 and 252: for measuring light elements like aluminum, silicon or sulfur
Collimator: fixed or 4x changeable, smallest measuring spot approx. 0.3mm
Primary filter: fixed or 6x changeable
Fixed sample support or a manual XY stage
Video camera for easy location of the best measurement site
Up to 17 cm sample height
Applications
Non-destructive analysis of dental alloys, silver test
Multilayer coatings
Analysis of functional coatings at least 10 nm thick in the electronics and semiconductor industry
Trace analysis in consumer protection, e.g. testing for the presence of lead in toys
Metal-alloy determinations according to the highest accuracy requirements in the jewelry industry and in refineries
For pricing, technical or any other questions please contact the supplier
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- No markups, no fees
- Direct contact with supplier
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Frequently Asked Questions
The advantage of the XAN series lies in their high-quality semiconductor detectors.
The XRF spectrometer can measure the thickness of coatings and analyze the composition of alloys.
The XAN series comprises 5 bench-top XRF spectrometers.
The XRF devices with a silicon drift detector, such as the XAN 220, are recommended for complex applications with alloys or precious metals.
The XAN 250 is suitable for detecting traces of heavy metals and hazardous substances.