MESO Metrology System
Description
MESO metrology system is a one-stop solution to many challenges in optical metrology. Shop floor measurements ensure quality control testing and in situ process control of your flat optics right next to the manufacturing line.
A unique instrument allows to measure at several different wavelengths with no chromatic abberrations and to characterize the whole range of your optics with no loss of resolution.
MESO™ is packed with innovation:
- LIFT-enhanced high wavefront sensing resolution
- POP-patent pending procedure for the testing of (thin) plane parallel optics
- Spot Tracker™ proprietary technology provides absolute measurement of tilt and wavefront.
MESO Metrology System
Specifications |
|
|---|---|
| Interferometer Configuration: | Not Specified |
| Light Source: | 1064nm |
| Output Polarization: | Linear, Circular |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
| Optical Axis: | text 108 mm |
| Dimensions: | text 63 x 30 x 45 cm |
| Phase Point Resolution: | text 680 x 500 |
Features
- Insensitive to vibrations
- At-design wavelength testing
- Insensitive to reflections from sample back surface
Applications
MESO is the perfect testing tool for the control of:
- Parallel Optics
- Screens
- Filters, dichroics
- Mirrors
- Beamsplitters
- Windows
- Substrates
- Corner cubes
- Crystals
- Rods, Disks
- Glass wafers
- Displays
- Machined surfaces
- Windshields
- Prisms
- Large lenses
- Optical systems
- Beam expanders
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
France
-
Sold by:
-
On FindLight:
since 2023
Frequently Asked Questions
The MESO metrology system is used for optical metrology, specifically for quality control testing and in situ process control of flat optics.
The MESO metrology system has features such as LIFT-enhanced high wavefront sensing resolution, a POP-patent pending procedure for testing thin plane parallel optics, and Spot Tracker™ proprietary technology for absolute measurement of tilt and wavefront.
No, the MESO metrology system is insensitive to vibrations, making it suitable for shop floor metrology.
Yes, the MESO metrology system can measure at several different wavelengths with no chromatic aberrations.
The MESO metrology system is used for testing parallel optics, screens, filters, mirrors, beamsplitters, windows, substrates, corner cubes, crystals, rods, disks, glass wafers, displays, machined surfaces, windshields, prisms, large lenses, and optical systems.