µPhase® 1000 Flexible Interferometer Sensor
Description
These highly integrated phase-shifting Twyman-Green interferometer sensors meet the toughest demands for modern quality management. In combination with the μShape™ measuring and analysis software these high-performance precision measuring instruments provide information about the specimen's surface deviation or wave front aberration.
µPhase® 1000 Flexible Interferometer Sensor
Specifications |
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|---|---|
| Interferometer Configuration: | Twyman–Green Interferometer |
| Light Source: | 632 nm or 633nm |
| Output Polarization: | Random |
| RMS Repeatability: | <0.01 waves |
| RMS Precision: | <0.01 waves |
Features
- Fast and non-destructive single-shot measurements
- High resolution camera
- Easy adaption to different sample reflectivities (µPhase® 1000 only)
- Ability to focus on sample surface (µPhase® 1000 only)
- Second Camera for alignment
- Compact size and modularity
- Robust, dust-proof housing
- Integration in production machines and production lines easily possible
- Standard measuring wavelength 632.8 nm; customized versions measuring at wavelengths from 355 nm to 1064 nm on request
- Well-structured and comprehensive software supports both production and laboratory use
For pricing, technical or any other questions please contact the supplier
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- No markups, no fees
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How to order?
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Ships from:
Germany
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
No, the µPhase® 1000 Flexible Interferometer Sensor is not designed for measuring large optics. The µPhase® PLANO 300 is specifically designed for that purpose.
The features of the µPhase® 1000 Flexible Interferometer Sensor include fast and non-destructive single-shot measurements, high resolution camera, easy adaption to different sample reflectivities, ability to focus on sample surface, second camera for alignment, compact size and modularity, robust, dust-proof housing, and integration in production machines and production lines easily possible.
The µPhase® 1000 Flexible Interferometer Sensor is used for high-performance precision measuring of a specimen's surface deviation or wave front aberration.
The standard measuring wavelength of the µPhase® 1000 Flexible Interferometer Sensor is 632.8 nm, but customized versions measuring at wavelengths from 355 nm to 1064 nm are available on request.
The µPhase® 1000 Flexible Interferometer Sensor is compatible with the µShape™ measuring and analysis software, which supports both production and laboratory use.