NSLI-632-1 N-Slit Laser Interferometer
Description
Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes.
NSLI-632-1 N-Slit Laser Interferometer
Specifications |
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|---|---|
| Interferometer Configuration: | Not Specified |
| Light Source: | 632 nm or 633nm |
| Output Polarization: | Not Specified |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Applications
- Arrays of micro holes and/or micro nozzles
- Biomedical and organic molecular arrays
- Crystalline surfaces
- Molecular, and digital, imaging surfaces
- Optical surfaces
- Textiles
- Transmission gratings
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United States
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Frequently Asked Questions
Yes, larger NSLI units with intra interferometric lengths up to 30 m and additional beam dimensions are available on request.
The N-Slit Laser Interferometer can be used for the characterization of arrays of micro holes and/or micro nozzles, biomedical and organic molecular arrays, crystalline surfaces, molecular, and digital, imaging surfaces, optical surfaces, textiles, and transmission gratings. It can also be used for the detection of clear air turbulence at airport’s runway thresholds, forensic science, optical metrology of surfaces and transmission gratings, and secure space-to-space interferometric communications.
The beam used as an illumination source in the NSLI is an extremely elongated Gaussian beam with a 30 μm height, at its center, and a 60000 μm width.
The N-Slit Laser Interferometer is used for the rapid interferometric characterization of transmission optical surfaces in general.
The wavelength of the NSLI-632-1 model is 632 nm.