VT750 & VT1200 Interferometer Workstations
Description
The XONOX VT1200 and VT750 represent precision interferometer workstations in convenient upward looking tower configurations. The integrated Fizeau interferometer offers precise surface metrology while the natural granite column with integrated air-bearing facilitates precise radius measurement capability. The workstation can be configured in a space-saving configuration with integrated touch-screen or can be equipped with separate computer cart and dual monitors.
VT750 & VT1200 Interferometer Workstations
Specifications |
|
|---|---|
| Interferometer Configuration: | Fizeau Interferometer |
| Light Source: | 632 nm or 633nm |
| Output Polarization: | Linear |
| RMS Repeatability: | Not Specified |
| RMS Precision: | Not Specified |
Features
- precision interferometer tower for production-, quality inspection- and metrology lab environments
- exceptionally large measuring range for radii up to 1400mm
- natural granite column with extremely flat and precise guiding surfaces provide for ease of use and very accurate measurement of radius of curvature on optical components
- highly precise and accurate linear scale with exceptional resolution, directly interfaced to fringe analysis software
- measurement table is balanced and guided on air bearing slide for quick, easy and accurate setup and movement
- small foot print and exceptional value combined with high accuracy and and rigid, maintenance free design
- robust vibration damping system, prefect for use in industrial production environments
- XONOX X-fiz 100 (4") or X-fiz 130 (5.2") high performance Fizeau interferometer with electronic control of optical zoom (1x to 10x) and focus
- innovative, powerful and user friendly fringe analysis system X-fringe2 with different smart and intelligent modes to suit various applications
- choose from low cost "ST" version with static fringe analysis up to high performance "PS2" phase shifting version
- system can be equipped either with PC table, 2 screens, mouse and keyboard or with built-in PC and and touch panel for optimized operation and minimized space requirement in production environment
- additionally available in a "tower only" version "B" for integrating existing or 3rd party interferometer units
Applications
- measurement of surface irregularity
- measurement of radius of curvature
- measurement of flatness
- measurement of reflected wavefront error
- measurement of transmitted wavefront error
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
Contact Supplier
How to order?
-
Ships from:
Germany
-
Sold by:
-
On FindLight:
since 2016
Frequently Asked Questions
The workstation is suitable for measurement of surface irregularity, radius of curvature, flatness, reflected wavefront error, and transmitted wavefront error.
The workstation has an exceptionally large measuring range for radii up to 1400mm.
The XONOX VT1200 and VT750 are precision interferometer workstations in convenient upward looking tower configurations.
The workstation has an innovative, powerful, and user-friendly fringe analysis system called X-fringe2 with different smart and intelligent modes to suit various applications.
The workstation features an integrated Fizeau interferometer that offers precise surface metrology.