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Virtual Reference Analyser
Description
The Virtual Reference™ Analyser is the next generation of chromatic dispersion measurement instruments based on our patented Virtual Reference™ Interferometer Technology. This elegant new solution for the high precision characterization of optical channels works with third party tunable laser systems (Agilent/Keysight 816XX series tunable lasers) to measureGroup Delay, Group Velocity Dispersion and Chromatic Dispersion all with a single sweep of a tunable laser.
Virtual Reference Analyser
Features
Fast single sweep operation
Highest accuracy measurements
Calibration free
Immune to thermal and vibrational effects
Simple user interface
Fast set-up and installation
Applications
Optical component test
Fiber characterization
Waveguide measurement
Nonlinear device test
QualityAssurance
Research & Development
For pricing, technical or any other questions please contact the supplier
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- No markups, no fees
- Direct contact with supplier
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Ships from:
Canada
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
The Virtual Reference Analyser is a chromatic dispersion measurement instrument that uses Virtual Reference Interferometer Technology to characterize optical channels.
The Virtual Reference Analyser has features such as fast single sweep operation, highest accuracy measurements, calibration-free operation, immunity to thermal and vibrational effects, and a simple user interface.
The Virtual Reference Analyser can be used for optical component test, fiber characterization, waveguide measurement, nonlinear device test, quality assurance, and research & development.
The Virtual Reference Analyser uses interferometry to characterize the dispersion properties of short length optical components. It replaces the physical reference path with a virtual reference, eliminating calibration errors and reducing test times.
The Virtual Reference Analyser is more cost-effective, accurate, and faster compared to traditional interferometers. It eliminates calibration errors, is immune to thermal and vibrational noise, and allows for single sweep characterization.
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