TMS-350L TopMap In.Line Fast Surface Characterization Setup
Description
The compact design of the TMS-350 TopMap In.Line enables an elegant and easy integration into the production line. The system measures the form deviation, such as flatness or waviness, without contact, reliably and within short cycle times. Since no objectives are needed, collisions and damage to the optics or sample are avoided. The white-light-interferometer measures even surfaces within deep holes with exact step heights from a safe working distance thanks to its special optical design.
TMS-350L TopMap In.Line Fast Surface Characterization Setup
Specifications |
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Light Source Type: | Pulsed LED |
Light Source Wavelength: | 525 nm |
Sample Reflectivity: | 1-1% |
Vertical Range: | 500000 nm |
RMS Repeatability: | <0.001 nm |
RMS Precision: | <0.001 nm |
Features
- Measurements within short cycle times thanks to the latest, high-speed sensor technology
- Highly precise z-axis resolution of just a few nanometers
- A high level of repeatability: tolerances checked reliably
- Robust and low-maintenance
- No detail is overlooked due to full-field (areal) measurement data
- Even very reflective or matte surfaces can be characterized
- Non-contact measurement principle: non-intrusive and non-destructive
- Integrated interface to in-house databases and QS-STAT™
For pricing, technical or any other questions please contact the supplier
- No registration required
- No markups, no fees
- Direct contact with supplier
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Ships from:
Germany
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Sold by:
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On FindLight:
External Vendor
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Frequently Asked Questions
The TMS-350L TopMap In.Line uses a white-light-interferometer to measure surfaces without contact, avoiding collisions and damage to the optics or sample.
The extended measuring range for the TMS-350L TopMap In.Line is 214.9 mm x 214.9 mm for lateral range and 500 µm for vertical range.
The maximum number of measuring points for the TMS-350L TopMap In.Line is 5116 for X, 5116 for Y, and 26173456 for X.Y.
The photobiological safety rating for the TMS-350L TopMap In.Line is IEC/EN 62471:2009-03.
The TMS-350L TopMap In.Line is used for fast surface characterization in the production line, measuring form deviation such as flatness or waviness without contact.