828-A HIGH-SPEED OPTICAL WAVELENGTH METER
Description
The 828 Series High-Speed Optical Wavelength Meter uses interferometer technology that is very different than that employed by other wavelength meters used for WDM wavelength testing applications. A Fizeau etalon design is used to generate a spatial interferogram that is detected by a fast InGaAs photodetector array. Using an on-board digital signal processor, the interferometric data is processed quickly into an accurate wavelength measurement. The combination of these technologies provides an unmatched, sustained measurement rate of 1 kHz.
828-A HIGH-SPEED OPTICAL WAVELENGTH METER
Specifications |
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|---|---|
| Wavelength Range: | 1250-1650nm |
| Accuracy: | 0.031 nm |
| Repeatability: | 0.03 pm |
Features
- Wavelength measured to an accuracy as high as ± 0.3 pm
- Measurement rate of 1 kHz for reduced testing times
- Automatic calibration with a built-in wavelength standard
- Measurement confidence level of ≥ 99.7%
- Traceable to NIST standards
- Simultaneous measurement of optical power to ± 0.5 dB
- High sensitivity of -40 dBm (0.1 µW)
- Operates with CW and modulated signals
- Rugged design for manufacturing environments
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Frequently Asked Questions
The 828 Series High-Speed Optical Wavelength Meter is a wavelength meter that uses interferometer technology to generate a spatial interferogram that is detected by a fast InGaAs photodetector array.
The wavelength measured to an accuracy as high as ± 0.3 pm.
The measurement confidence level of the 828 Series High-Speed Optical Wavelength Meter is ≥ 99.7%.
The 828 Series High-Speed Optical Wavelength Meter has a measurement rate of 1 kHz for reduced testing times.
The 828 Series High-Speed Optical Wavelength Meter has a high sensitivity of -40 dBm (0.1 µW).